Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST
Pages 105 - 110
Abstract
Analog BIST and SoC testing are two topics that have been extensively, but independently, studied in the last few years. However, current mixed-signals systems require the combination of these subjects to generate a cost-effective test solution for the whole SoC. This paper discusses the impact on the global system testing time of an analog BIST method based on digital reuse. Experimental results show that the reuse of digital blocks to test analog signals is indeed a very efficient strategy, even under power constraints, as long as the BIST technique reduces the analog testing time.
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Index Terms
- Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST
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Published In
September 2004
296 pages
ISBN:1581139470
DOI:10.1145/1016568
- General Chair:
- Edna Natividade da Silva Barros,
- Program Chairs:
- Flàvio Rech Wagner,
- Luigi Carro,
- Franz Josef Rammig
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Published: 04 September 2004
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SBCCI04: 17th Symposium on Integrated Circuits and System Design
September 7 - 11, 2004
Pernambuco, Brazil
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