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What will system level design be when it grows up?

Published: 19 September 2005 Publication History

Abstract

We have seen a growing new interest in Electronic System Level (ESL) architectures, design methods, tools and implementation fabrics in the last few years. But the picture of what types and approaches to building embedded systems will become the most widely-accepted norms in the future remains fuzzy at best. Everyone want to know where systems and system design is going "when it grows up", if it ever "grows up". Some of the key questions that need to be answered include which applications will be key system drivers, what SW & HW architectures will suit best, how programmable and configurable will they be, will systems designers need to deal with physical implementation issues or will that be hidden behind fabric abstractions and programming models, and what will those abstractions and models be? Moreover, will these abstractions stabilize and be still useful as the underlying technology keeps developing at high speed.This panel consists of proponents of a number of alternative visions for where we will end up, and how we will get there.

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cover image ACM Conferences
CODES+ISSS '05: Proceedings of the 3rd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
September 2005
356 pages
ISBN:1595931619
DOI:10.1145/1084834
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 19 September 2005

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Author Tags

  1. parametric yield
  2. process variability
  3. system-level compensation

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CODES/ISSS05

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CODES+ISSS '05 Paper Acceptance Rate 50 of 200 submissions, 25%;
Overall Acceptance Rate 280 of 864 submissions, 32%

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