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Meta-level patterns for interactive knowledge capture

Published:02 October 2005Publication History

ABSTRACT

Current knowledge acquisition tools have limited understanding of how users enter knowledge and how acquired knowledge is used, and provide limited assistance in organizing various knowledge authoring tasks. Users have to make up for these shortcomings by keeping track of past mistakes, current status, potential new problems, and possible courses of actions by themselves. In this paper, we present a novel extension to existing knowledge acquisition tools where the system organizes the episodes of past interactions through a set of declarative meta-level patterns and improves its suggestions based on relevant episodes. In particular, we focus on 1) assessing the level of confidence in suggesting an action, 2) suggesting how a knowledge authoring action can be done based on successful past actions, and 3) monitoring dynamic changes in the environment to suggest relevant modifications in the knowledge base. A preliminary study with varying synthetic user interactions shows that this meta-level assessment may reduce the number of incorrect suggestions, prevent some of the user mistakes and improve the overall problem solving results.

References

  1. Kim, J. Reflection Patterns for Interactive Knowledge Capture,http://www.isi.edu/~jihie/papers/echo-RP.pdf.Google ScholarGoogle Scholar
  2. Kim, J. and Gil, Y., Acquiring Problem-Solving Knowledge from End Users: Putting Interdependency Models to the Test. Proceedings of AAAI-2000, 2000. Google ScholarGoogle ScholarDigital LibraryDigital Library

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  1. Meta-level patterns for interactive knowledge capture

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    • Published in

      cover image ACM Conferences
      K-CAP '05: Proceedings of the 3rd international conference on Knowledge capture
      October 2005
      234 pages
      ISBN:1595931635
      DOI:10.1145/1088622

      Copyright © 2005 ACM

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 2 October 2005

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      Overall Acceptance Rate55of198submissions,28%

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