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Autonomous-repair cell for fault tolerant dynamic-reconfigurable devices

Published: 22 February 2006 Publication History

Abstract

Reconfigurable devices are expected to be utilized in the mission-critical fields such as space development, because a system update and a pseudo-repair can be achieved remotely by reconfiguration. However, conventional reconfigurable devices suffer from memory bit upsets caused by charged particles in space that result in fatal system troubles.This paper proposes an autonomous repair mechanism against configuration upsets for fault-tolerant reconfigurable devices. In proposed architecture, devices consist of 'Autonomous-Repair Cells' with built-in (not reprogrammable) error recovery circuits. Each cell realizes a part of the system's functionality, and guarantees fault tolerance against upset of its own configuration memory. In this paper, four types of Autonomous-Repair Cells are designed and then average lifetime is analyzed. Two of cells are based on TMR (Triple Module Redundancy) and the others are based on EDAC (Error Detection and Correction). In a severe situation where a conventional reconfigurable device with 1Mbit configuration data can achieve only 1-minute average lifetime against configuration upsets, all proposed cells can achieve more than 100 years.

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  • (2018)Dependable design technique for system-on-chipJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2007.09.00354:3-4(452-464)Online publication date: 29-Dec-2018
  • (2013)Fault-Tolerant and Fail-Safe Design based on ReconfigurationSmall and Medium Enterprises10.4018/978-1-4666-3886-0.ch035(695-714)Online publication date: 2013
  • (2011)Fault-Tolerant and Fail-Safe Design Based on ReconfigurationDesign and Test Technology for Dependable Systems-on-Chip10.4018/978-1-60960-212-3.ch008(175-194)Online publication date: 2011

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  1. Autonomous-repair cell for fault tolerant dynamic-reconfigurable devices

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      cover image ACM Conferences
      FPGA '06: Proceedings of the 2006 ACM/SIGDA 14th international symposium on Field programmable gate arrays
      February 2006
      248 pages
      ISBN:1595932925
      DOI:10.1145/1117201
      • General Chair:
      • Steve Wilton,
      • Program Chair:
      • André DeHon
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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      Published: 22 February 2006

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      Cited By

      View all
      • (2018)Dependable design technique for system-on-chipJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2007.09.00354:3-4(452-464)Online publication date: 29-Dec-2018
      • (2013)Fault-Tolerant and Fail-Safe Design based on ReconfigurationSmall and Medium Enterprises10.4018/978-1-4666-3886-0.ch035(695-714)Online publication date: 2013
      • (2011)Fault-Tolerant and Fail-Safe Design Based on ReconfigurationDesign and Test Technology for Dependable Systems-on-Chip10.4018/978-1-60960-212-3.ch008(175-194)Online publication date: 2011

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