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View all- Pomeranz I(2020)Non-Masking Non-Robust Tests for Path Delay Faults2020 IEEE 38th VLSI Test Symposium (VTS)10.1109/VTS48691.2020.9107556(1-6)Online publication date: Apr-2020
- Pomeranz I(2017)Test Compaction with Dynamic Updating of Faults for Coverage of Undetected Transition Fault Sites2017 IEEE 26th Asian Test Symposium (ATS)10.1109/ATS.2017.19(34-39)Online publication date: Nov-2017
- Baláž MDobai RGramatová E(2011)Delay Faults TestingDesign and Test Technology for Dependable Systems-on-Chip10.4018/978-1-60960-212-3.ch017(377-394)Online publication date: 2011
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