ABSTRACT
Violations of the timing constraints in a clocked register can cause a synchronous system to malfunction. The effects of parameter variations on the timing characteristics of registers that determine the timing constraints are investigated in this paper. The sensitivity of the setup time and data propagation delay to variations in power supply voltage, temperature, and gate oxide thickness is demonstrated for four different register designs. Furthermore, design modifications are proposed that enhance the robustness of each register to variation effects.
- I. S. Kourtev and E. G. Friedman, Timing Optimization Through Clock Skew Scheduling Norwell Massachusetts: Kluwer Academic Publishers, 2000. Google ScholarDigital Library
- S. Sauter, D. Schmitt-Landsiedel, R. Thewes, and W. Weber, "Effect of parameter variations at chip and wafer level on clock skews, "IEEE Transactions on Semiconductor Manufacturing vol. 13, no. 4, pp. 395--400, November 2000.Google ScholarCross Ref
- S. Natarajan, M. A. Breuer, andS. K. Gupta, "Process variations and their impact on circuit operation, "Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems pp. 73--81, November 1998. Google ScholarDigital Library
- K. T. Tang and E. G. Friedman, "Delay and noise estimation of cmos logic gates driving coupled rc interconnections, "Integration, the VLSI Journal vol. 29, no. 2, pp. 131--165, September 2000. Google ScholarDigital Library
- D. Velenis, M. C. Papaefthymiou, and E. G. Friedman, "Reduced delay uncertainty in high performance clock distribution networks, "Proceedings of the IEEE Design Automation and Test in Europe Conference pp. 68--73, March 2003. Google ScholarDigital Library
- R. Sitte, S. Dimitrijev, and H. B. Harrison, "Device parameter changes caused by manufacturing fluctuations of deep submicron mosfet 's, "IEEE Transactions on Electron Devices vol. 41, no. 11, pp. 2210--2215, November 1994.Google ScholarCross Ref
- N. H. Weste and D. Harris, CMOS VLSI Design: A Circuits and Systems Perspective 3rded. Boston: Addison-Wesley, May 2004.Google Scholar
- G. Gerosa, S. Gary, C. Dietz, D. Pham, K. Hoover, J. Alverez, H. Sanchez, P. Ippolito, T. Ngo, S. Litch, J. Eno, J. Golab, N. Vanderschaaf, and J. Kahle, "A 2. 2 w, 80 mhz superscaler risc microprocessor, "IEEE Journal of Solid-State Circuits vol. 29, no. 12, pp. 1440--1454, December 1994.Google ScholarCross Ref
- V. Stojanovic and V. G. Oklobzijia, "Comparative analysis of master-slave latches and flip flops for high-performance and low-power systems, "IEEE Journal of Solid-State Circuits vol. 34, no. 4, pp. 536--548, April 1999.Google ScholarCross Ref
- H. Partovi, R. Burd, U. Salim, F. Weber, L. DiGregorio, and D. Draper, "Flow-through latch and edge-triggered flip-flop hybrid elements, "IEEE International Solid-State Circuits Conference pp. 138--139, Febuary 1996.Google Scholar
- A. V. Mezhiba and E. G. Friedman, Power Distribution Networks in High Speed Integrated Circuits Norwell Massachusetts: Kluwer Academic Publishers, 2004. Google ScholarDigital Library
- S. I. A., "The national technology roadmap for semiconductors, "Semiconductor Industry Association, Tech. Rep., 2004.Google Scholar
Index Terms
- Effects of process and environmental variations on timing characteristics of clocked registers
Recommendations
Parameter variation effects on timing characteristics of high performance clocked registers
PATMOS'05: Proceedings of the 15th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and SimulationViolations in the timing constraints of a clocked register can cause a synchronous system to malfunction. The effects of parameter variations on the timing characteristics of registers that determine the timing constraints are investigated in this ...
Effect of process variations in 3D global clock distribution networks
In three-dimensional (3D) integrated circuits, the effect of process variations on clock skew differs from 2D circuits. The combined effect of inter-die and intra-die process variations on the design of 3D clock distribution networks is considered in ...
Timing model extraction for sequential circuits considering process variations
ICCAD '09: Proceedings of the 2009 International Conference on Computer-Aided DesignAs semiconductor devices continue to scale down, process variations become more relevant for circuit design. Facing such variations, statistical static timing analysis is introduced to model variations more accurately so that the pessimism in ...
Comments