Cited By
View all- Lakhani FPont M(2012)Applying Design Patterns to Improve the Reliability of Embedded Systems through a Process of Architecture MigrationProceedings of the 2012 IEEE 14th International Conference on High Performance Computing and Communication & 2012 IEEE 9th International Conference on Embedded Software and Systems10.1109/HPCC.2012.228(1563-1570)Online publication date: 25-Jun-2012
- Lakhani FDas APont MAvgeriou PWeiss M(2010)Improving the reliability of embedded systems as complexity increasesProceedings of the 15th European Conference on Pattern Languages of Programs10.1145/2328909.2328937(1-17)Online publication date: 7-Jul-2010