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- Seok MKinget PYang TLi JKim D(2018)Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper2018 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS.2018.8353612(5C.1-1-5C.1-6)Online publication date: Mar-2018
- Kachave DSengupta ANeema SSri Harsha P(2018)Effect of NBTI stress on DSP cores used in CE devices: threat model and performance estimationIET Computers & Digital Techniques10.1049/iet-cdt.2018.508112:6(268-278)Online publication date: 3-Oct-2018
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