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NBTI resilient circuits using adaptive body biasing

Published: 04 May 2008 Publication History

Abstract

Reliability has become a practical concern in today's VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance warnings before system errors occur. This paper presents a reliability monitor design for NBTI (Negative Bias Temperature Instability). NBTI is recognized as very critical as it leads to short device lifetime. The proposed reliability monitor not only tracks the NBTI effect but also mitigates the degradation by forward biasing the PMOS. A worst case scenario static stress experiment demonstrates two orders of magnitude improvement in system lifetime using PTM 65nm technology. A ring oscillator example shows how frequency degradation can be compensated. Deployment of the proposed NBTI monitor is also discussed and two compatible strategies are provided to incorporate these monitors efficiently: the first focuses on low area overhead while the second features low power.

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  • (2019)On Chip Reconfigurable CMOS Analog Circuit Design and Automation Against Aging PhenomenaACM Transactions on Design Automation of Electronic Systems10.1145/332506924:4(1-22)Online publication date: 28-Jun-2019
  • (2018)Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper2018 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS.2018.8353612(5C.1-1-5C.1-6)Online publication date: Mar-2018
  • (2018)Effect of NBTI stress on DSP cores used in CE devices: threat model and performance estimationIET Computers & Digital Techniques10.1049/iet-cdt.2018.508112:6(268-278)Online publication date: 3-Oct-2018
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      cover image ACM Conferences
      GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSI
      May 2008
      480 pages
      ISBN:9781595939999
      DOI:10.1145/1366110
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 04 May 2008

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      Author Tags

      1. body bias
      2. nbti
      3. reliability

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      GLSVLSI08: Great Lakes Symposium on VLSI 2008
      May 4 - 6, 2008
      Florida, Orlando, USA

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      Overall Acceptance Rate 312 of 1,156 submissions, 27%

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      View all
      • (2019)On Chip Reconfigurable CMOS Analog Circuit Design and Automation Against Aging PhenomenaACM Transactions on Design Automation of Electronic Systems10.1145/332506924:4(1-22)Online publication date: 28-Jun-2019
      • (2018)Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper2018 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS.2018.8353612(5C.1-1-5C.1-6)Online publication date: Mar-2018
      • (2018)Effect of NBTI stress on DSP cores used in CE devices: threat model and performance estimationIET Computers & Digital Techniques10.1049/iet-cdt.2018.508112:6(268-278)Online publication date: 3-Oct-2018
      • (2017)Contemporary CMOS aging mitigation techniquesIntegration, the VLSI Journal10.1016/j.vlsi.2017.03.01359:C(10-22)Online publication date: 1-Sep-2017
      • (2015)Lifetime Reliability Enhancement of MicroprocessorsACM Computing Surveys10.1145/278598848:1(1-25)Online publication date: 29-Sep-2015
      • (2015)SymmTop: A Symmetric Circuit Topology for Ultra Low Power Wide Temperature-Range Applications2015 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2015.105(585-590)Online publication date: Jul-2015
      • (2014)ARO-PUFProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616692(1-6)Online publication date: 24-Mar-2014
      • (2014)Analysis and Evaluation on NBTI-Induced Circuit AgingApplied Mechanics and Materials10.4028/www.scientific.net/AMM.513-517.3976513-517(3976-3982)Online publication date: Feb-2014
      • (2014)Modeling and Experimental Demonstration of Accelerated Self-Healing TechniquesProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2593162(1-6)Online publication date: 1-Jun-2014
      • (2014)Dynamic IndexingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2013.228718733:2(251-264)Online publication date: 1-Feb-2014
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