Costas Argyrides
ABSTRACT
Memories are among the densest integrated circuits that can be fabricated and therefore, have the highest rate of defects. This paper discusses an efficient technique for designing low cost high defect tolerant RAM chips. A 25% improvement in the yield is presented. The paper proposes a scheme that selects the right redundancy in memory designs driven by the fabrication cost and the yield. The new memory chip design technique fills the gap between the existing all-or-none extremes with memories. The area is sacrificed for these performance improvements, for significant power savings as well as for the significant improvement in the yield.
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Index Terms
- Yield improvement and power aware low cost memory chips
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