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Design and CAD for 3D integrated circuits

Published:08 June 2008Publication History

ABSTRACT

High density Through Silicon Vias (TSV) can be used to build 3DICs that enable unique applications in computing, signal processing and memory intensive systems. This paper presents several case studies that are uniquely enhanced through 3D implementation, including a 3D CAM, an FFT processor, and a SAR processor. The CAD flow used to implement for these designs is described. 3DIC requires higher fidelity thermal modeling than 2DIC design. The rationale for this requirement is established and a possible solution is presented.

References

  1. W. Davis, J. Wilson, S. Mick, J. Xu, H. Hua, C. Mineo, A. Sule, M. Steer, and P. D. Franzon, "Demystifying 3D ICs: The Pros and Cons of Going Veritical," IEEE Design and Test of Computers, VOl. 222, No. 6, Nov-Dec, 2005, pp. 498--510. Bowman, M., Debray, S. K., and Peterson, L. L. 1993Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. E. C. Oh, P. D. Franzon, "Design Considerations and benefits of Three-Dimensional Temary Content Addressable Memory," Proc. IEEE CICC, Oct., 2007.Google ScholarGoogle Scholar
  3. H. Hua, "Design and Verification Methodology for Complex Three-Dimensional Digital Integrated Circuits," Ph.D. Dissertation, NC State University, 2006.Google ScholarGoogle Scholar
  4. K. Schoenfliess, "Performance Analsysi of System-on-Chip Application of 3D Integrated Circuits," MS. Thesis, NC State University.Google ScholarGoogle Scholar
  5. H. P Hofstee, "Future Microprocessors and off-chip SOP Interconnect," in IEEE Trans. Advanced Packaging, Vol. 27, No. 2, May 2004, pp. 301--303.Google ScholarGoogle ScholarCross RefCross Ref
  6. P. Li, et al., "IC thermal simulation and modeling via efficient multigrid-based approaches." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, Vol. 25, pp. 1763--1776. Google ScholarGoogle ScholarDigital LibraryDigital Library
  7. P. Phelan and R. Niemann, "Effective Thermal Conductivity of a Thin, Randomly Oriented Composite Material." Journal of Heat Transfer, s.l., ASME, 1998, Vol. 120, pp. 971--976.Google ScholarGoogle ScholarCross RefCross Ref
  8. J. Wang, et al., "A new approach to modelling the effective thermal conductivity of heterogeneous materials." International Journal of Heat and Mass Transfer, 2006, Vol. 49, pp. 3075--3083.Google ScholarGoogle ScholarCross RefCross Ref
  9. R. Hoofman, et al., "Challenges in the implementation of low-k dielectrics in the back-end of line." Microelectronic Engineering, 2005, Vol. 80, pp. 337--344. Google ScholarGoogle ScholarDigital LibraryDigital Library
  10. Z. Luo, et al., "High Performance Transistors Featured in an Aggressively Scaled 45nm Bulk CMOS Technology." 2007. pp. 16--17.Google ScholarGoogle Scholar
  11. E. Richard, et al., "Manufacturability and Speed Performance Demonstration of Porous ULK (k=2.5) for a 45nm CMOS Platform." 2007. pp. 178--17.Google ScholarGoogle Scholar

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  1. Design and CAD for 3D integrated circuits

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        • Published in

          cover image ACM Conferences
          DAC '08: Proceedings of the 45th annual Design Automation Conference
          June 2008
          993 pages
          ISBN:9781605581156
          DOI:10.1145/1391469
          • General Chair:
          • Limor Fix

          Copyright © 2008 ACM

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          New York, NY, United States

          Publication History

          • Published: 8 June 2008

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