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Accurate and analytical statistical spatial correlation modeling for VLSI DFM applications

Published:08 June 2008Publication History

ABSTRACT

With the significant advancement of statistical timing and yield analysis algorithms, there is a strong need for accurate and analytical spatial correlation models. In this paper, we propose a novel spatial correlation modeling method not only can capture the general spatial correlation relationship but also can generate highly accurate and analytical models. Our method, based on Singular Value Decomposition (SVD), can generate sequences of polynomial weighted by the singular values. Experimental results from foundry measurement data show that our proposed approach is 5X accuracy improvement over several distance based spatial correlation modeling methods.

References

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  1. Accurate and analytical statistical spatial correlation modeling for VLSI DFM applications

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    • Published in

      cover image ACM Conferences
      DAC '08: Proceedings of the 45th annual Design Automation Conference
      June 2008
      993 pages
      ISBN:9781605581156
      DOI:10.1145/1391469
      • General Chair:
      • Limor Fix

      Copyright © 2008 ACM

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      Association for Computing Machinery

      New York, NY, United States

      Publication History

      • Published: 8 June 2008

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