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A word-oriented transistor driven non-destructive readout memory

Published:03 May 1960Publication History

ABSTRACT

Using three-aperture ferrite memory cells, a 512-word non-destructive readout memory has been operated with transistor drivers. Writing and reading are both achieved with bipolar two-pulse sequences, which are, respectively, ERASE, WRITE and SET, READ. Due to the inherently non-destructive manner in which the cells are operated, no regeneration cycle is necessary to restore information to interrogated cells. The necessary bipolar writing and reading pulse sequences are conveniently provided by a novel magnetic switch matrix, in which all rows and columns are driven in coincidence except those intersecting at the desired address. The resultant driving current at the desired address is the sum of all the transistor driver currents, or 2(n-1) times the individual transistor driver currents for an "n" square matrix.

References

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  6. Constantine, G., Jr., "A Load-Sharing Matrix Switch", IBM Journal of Research, p204; July, 1958.Google ScholarGoogle Scholar

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  • Published in

    cover image ACM Conferences
    IRE-AIEE-ACM '60 (Western): Papers presented at the May 3-5, 1960, western joint IRE-AIEE-ACM computer conference
    May 1960
    391 pages
    ISBN:9781450378697
    DOI:10.1145/1460361

    Copyright © 1960 ACM

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    • Published: 3 May 1960

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