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A strategy for detecting faults in sequential machines not possessing distinguishing sequences

Published: 17 November 1970 Publication History

Abstract

The problem treated here is that of detecting faults in digital equipment by applying input sequences at the input terminals and observing output sequences at the output terminals. The checking of digital equipment by input/output tests applied at the terminals is motivated by current and future usage of large-scale integration techniques which make internal test points generally inaccessible for testing purposes. The modeling of digital equipment by finite-state sequential machines and then designing fault-detection tests based on the state table is a general approach. The difficulty is that it results in very long experiments for large state tables, particularly for the case in which the state table does not possess a distinguishing sequence. that is, an input sequence for which the response uniquely identifies the initial state. This paper presents a strategy for designing more efficient fault-detection tests for machines not possessing distinguishing sequences.

References

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E F Moore Gedanken-experiments on sequential machines Automata Studies pp 129--153 Princeton University Press Princeton New Jersey 1956
[2]
A Gill Introduction to the theory of finite-state machines McGraw-Hill Book Company New York 1962
[3]
T N Hibbard Least upper bounds on minimal terminal state experiments for two classes of sequential machines J Assoc Comp Mach Vol 8 pp 601--612 October 1961
[4]
F C Hennie Fault detecting experiments for sequential circuits Proc 5th Annual Symposium on Switching Circuit Theory and Logical Design pp 95--110 Princeton New Jersey November 1964
[5]
C R Kime An organization for checking experiments on sequential circuits IEEE Transactions on Electronic Computers (Short notes) Vol EC-15 pp 113--115 February 1966
[6]
Z Kohavi P Lavallee Design of sequential machines with fault-detection capabilities IEEE Transactions on Electronic Computers Vol EC-16 pp 473--484 August 1967
[7]
I Kohavi Z Kohavi Variable-length distinguishing sequences and their application to the design of fault-detection experiments IEEE Transactions on Computers (Short notes) Vol C-17 pp 792--795 August 1968

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cover image ACM Other conferences
AFIPS '70 (Fall): Proceedings of the November 17-19, 1970, fall joint computer conference
November 1970
683 pages
ISBN:9781450379045
DOI:10.1145/1478462
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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  • AFIPS: American Federation of Information Processing Societies

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 17 November 1970

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