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An on-chip solution for static ADC test and measurement

Published: 10 May 2009 Publication History

Abstract

This paper presents a solution for implementing low-cost ADC BIST into a System-on-Chip design. The solution is based on generating a programmable ramp as a test signal into the ADC and measuring the linear parameters using the histogram based test. An original approach for accurately measuring the Hits-per-Code as the ramp traverses the ADC transfer curve is presented. In particular, it is shown that code transitions or code flicker noise have an impact on the overall accuracy. This test procedure permits a ramp generator implementation and test engine design that is predominantly a digital solution. Results demonstrate lower silicon area overheads and lower test time capability.

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Cited By

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  • (2012)Testing of Trusted CMOS Data ConvertersProceedings of the 2012 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2012.23(350-355)Online publication date: 19-Aug-2012
  • (2010)A robust ADC code hit counting techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871349(1749-1754)Online publication date: 8-Mar-2010
  • (2009)A2DTest: A complete integrated solution for on-chip ADC self-test and analysis2009 International Test Conference10.1109/TEST.2009.5355722(1-10)Online publication date: Nov-2009
  • Show More Cited By

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    cover image ACM Conferences
    GLSVLSI '09: Proceedings of the 19th ACM Great Lakes symposium on VLSI
    May 2009
    558 pages
    ISBN:9781605585222
    DOI:10.1145/1531542
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 10 May 2009

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    Author Tags

    1. ADC-BiST
    2. analog to digital converter
    3. code histogram
    4. linearity measurements
    5. system-on-chip
    6. test

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    May 10 - 12, 2009
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    View all
    • (2012)Testing of Trusted CMOS Data ConvertersProceedings of the 2012 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2012.23(350-355)Online publication date: 19-Aug-2012
    • (2010)A robust ADC code hit counting techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871349(1749-1754)Online publication date: 8-Mar-2010
    • (2009)A2DTest: A complete integrated solution for on-chip ADC self-test and analysis2009 International Test Conference10.1109/TEST.2009.5355722(1-10)Online publication date: Nov-2009
    • (2009)A prototype platform for system-on-chip ADC test and measurement2009 IEEE International SOC Conference (SOCC)10.1109/SOCCON.2009.5398065(169-172)Online publication date: Sep-2009

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