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Statistical static timing analysis considering leakage variability in power gated designs

Published: 19 August 2009 Publication History

Abstract

This paper is the first to study the impact of fluctuations in virtual power supply rail (vvdd) of power-gated designs on the circuit timing, where the vvdd fluctuations are due to process-induced leakage variability. We present a Monte Carlo-based statistical static timing analysis (SSTA) framework which accurately accounts for process-induced leakage variability and its impact on vvdd fluctuations and timing. For vvdd computation we propose an efficient and fast converging iterative analysis, which we explore to result in minimal additional complexity to traditional SSTA where leakage variability is not considered during analysis. We provide separate discussions for the two cases of SSTA for power-gated ASICs and microprocessors; in the latter we also consider process-induced dynamic power variability. In our simulations, we show significant error in traditional SSTA. We also study the impact of number of power-gated clusters on leakage variability, vvdd fluctuations and timing variations. We show that increase in the number of power-gated clusters reduces the circuit timing variance.

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    cover image ACM Conferences
    ISLPED '09: Proceedings of the 2009 ACM/IEEE international symposium on Low power electronics and design
    August 2009
    452 pages
    ISBN:9781605586847
    DOI:10.1145/1594233
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 19 August 2009

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    Author Tags

    1. leakage
    2. power gating
    3. process variations
    4. ssta

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    ISLPED '09 Paper Acceptance Rate 72 of 208 submissions, 35%;
    Overall Acceptance Rate 398 of 1,159 submissions, 34%

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