Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits
Article No.: 7, Pages 1 - 22
Abstract
In enhanced-scan circuits, a two-pattern test < ti, tj > for a transition fault can be obtained by using a test tj that detects a stuck-at fault, and preceding it by a test ti that activates another stuck-at fault. Thus, test generation for transition faults can be done by combining pairs of stuck-at tests. This provides an alternative to deterministic test generation, as well as reduces the test storage requirements for transition fault tests. We study the possibility of generating scan-based tests for transition faults in standard-scan circuits in a similar way, by combining pairs of stuck-at tests. Since it is not always possible to obtain a standard-scan test that is equivalent to a two-pattern test < ti, tj > based on stuck-at tests ti and tj, it is not always possible to guarantee that the combination of ti and tj will detect a transition fault. To compensate for this, it is necessary to try combinations of different stuck-at test pairs, resulting in an increased simulation effort to compute effective standard-scan tests. Our focus in this work is on reducing this simulation effort by reducing the number of stuck-at test pairs that need to be considered.
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- Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits
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Publication History
Published: 28 December 2009
Accepted: 01 September 2009
Revised: 01 February 2009
Received: 01 July 2008
Published in TODAES Volume 15, Issue 1
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