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Characterizing the soft error vulnerability of multicores running multithreaded applications

Published: 14 June 2010 Publication History

Abstract

Multicores have become the platform of choice across all market segments. Cost-effective protection against soft errors is important in these environments, due to the need to move to lower technology generations and the exploding number of transistors on a chip. While multicores offer the flexibility of varying the number of application threads and the number of cores on which they run, the reliability impact of choosing one configuration over another is unclear. Our study reveals that the reliability costs vary dramatically between configurations and being unaware could lead to a sub-optimal choice.

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Cited By

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  • (2018)Reliability-aware core partitioning in chip multiprocessorsJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2012.02.00558:3-4(160-176)Online publication date: 29-Dec-2018
  • (2018)Reliability aware throughput management of chip multi-processor architecture via thread migrationThe Journal of Supercomputing10.1007/s11227-016-1665-372:4(1363-1380)Online publication date: 31-Dec-2018
  • (2014)Comprehensive and Efficient Design Parameter Selection for Soft Error Resilient Processors via Universal RulesIEEE Transactions on Computers10.1109/TC.2013.2463:9(2201-2214)Online publication date: Sep-2014
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  1. Characterizing the soft error vulnerability of multicores running multithreaded applications

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      cover image ACM Conferences
      SIGMETRICS '10: Proceedings of the ACM SIGMETRICS international conference on Measurement and modeling of computer systems
      June 2010
      398 pages
      ISBN:9781450300384
      DOI:10.1145/1811039
      • cover image ACM SIGMETRICS Performance Evaluation Review
        ACM SIGMETRICS Performance Evaluation Review  Volume 38, Issue 1
        Performance evaluation review
        June 2010
        382 pages
        ISSN:0163-5999
        DOI:10.1145/1811099
        Issue’s Table of Contents

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      New York, NY, United States

      Publication History

      Published: 14 June 2010

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      Author Tags

      1. fit rate
      2. multicore
      3. soft errors

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      View all
      • (2018)Reliability-aware core partitioning in chip multiprocessorsJournal of Systems Architecture: the EUROMICRO Journal10.1016/j.sysarc.2012.02.00558:3-4(160-176)Online publication date: 29-Dec-2018
      • (2018)Reliability aware throughput management of chip multi-processor architecture via thread migrationThe Journal of Supercomputing10.1007/s11227-016-1665-372:4(1363-1380)Online publication date: 31-Dec-2018
      • (2014)Comprehensive and Efficient Design Parameter Selection for Soft Error Resilient Processors via Universal RulesIEEE Transactions on Computers10.1109/TC.2013.2463:9(2201-2214)Online publication date: Sep-2014
      • (2013)Examining Thread Vulnerability analysis using fault-injection2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)10.1109/VLSI-SoC.2013.6673282(240-245)Online publication date: Oct-2013
      • (2013)Predicting Architectural Vulnerability on Multithreaded Processors under Resource Contention and SharingIEEE Transactions on Dependable and Secure Computing10.1109/TDSC.2012.8710:2(114-127)Online publication date: 1-Mar-2013
      • (2011)Computing and Reducing Transient Error Propagation in RegistersJournal of Computing Science and Engineering10.5626/JCSE.2011.5.2.1215:2(121-130)Online publication date: 30-Jun-2011
      • (2011)Universal rules guided design parameter selection for soft error resilient processors(IEEE ISPASS) IEEE INTERNATIONAL SYMPOSIUM ON PERFORMANCE ANALYSIS OF SYSTEMS AND SOFTWARE10.1109/ISPASS.2011.5762741(247-256)Online publication date: Apr-2011
      • (2019)Thread vulnerability in parallel applicationsJournal of Parallel and Distributed Computing10.1016/j.jpdc.2012.05.00272:10(1171-1185)Online publication date: 4-Jan-2019
      • (2014)Comprehensive and Efficient Design Parameter Selection for Soft Error Resilient Processors via Universal RulesIEEE Transactions on Computers10.1109/TC.2013.2463:9(2201-2214)Online publication date: Sep-2014

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