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- Karmakar RChattopadhyay S(2017)Temperature and data size trade-off in dictionary based test data compressionIntegration, the VLSI Journal10.1016/j.vlsi.2016.11.00257:C(20-33)Online publication date: 1-Mar-2017
- Chakraborty SSarkar TPradhan S(2017)Leakage Reduction by Test Pattern ReorderingProceedings of the International Conference on Nano-electronics, Circuits & Communication Systems10.1007/978-981-10-2999-8_5(55-68)Online publication date: 25-Mar-2017
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