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Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives

Published: 18 August 2010 Publication History

Abstract

We study the impact of statistical leakage modeling on the yield of memory designs. We critically evaluate different closed form models from a rare fail event perspective and propose CDF matching as a comprehensive and effective approach for accurate statistical leakage modeling. While Schwartz-Yeh method is found to match the body and left tail of the distribution, the Fenton-Wilkinson method aims more at matching the right tail of the distribution. The latter is more critical for purposes of yield estimation in the presence of leaky bitlines devices, as the right tail region is more crucial. However, for practical applications, it is shown that even Fenton-Wilkinson method leads to reduced accuracy compared to the CDF matching method. The error in estimating the probability of a false-read is shown to range from 10x-147x and is expected to increase with technology scaling.

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Rasouli et al., ICCAD 09, pp. 505--512.
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N.C. Beaulieu et al., IEEE Trans. Comm. Dec 1995, pp.2869--2873
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A. papoulis, Probability, Random Variables and Stochastic Processes. NY McGraw Hill 1991.
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Cardieri et al, IEEE VTC 2000. pp. 1823--1827.
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S.C. Schwartz et al., Bell Syst. Tech, Sep. 1982, pp 1441--1462.

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  • (2011)The impact of statistical leakage models on design yield estimationVLSI Design10.1155/2011/4719032011(1-12)Online publication date: 1-Jan-2011

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  1. Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives

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    cover image ACM Conferences
    ISLPED '10: Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
    August 2010
    458 pages
    ISBN:9781450301466
    DOI:10.1145/1840845
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 18 August 2010

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    • (2011)The impact of statistical leakage models on design yield estimationVLSI Design10.1155/2011/4719032011(1-12)Online publication date: 1-Jan-2011

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