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Redundancy in SAR ADCs

Published: 02 May 2011 Publication History

Abstract

In this paper, we discuss and analyze the effectiveness of redundancy (also known as digital error correction) and its relationship with DAC settling time, comparator delay, digital logic delay and sampling rate in successive-approximation-register (SAR) ADCs. Behavioral models of SAR ADCs are developed that are four orders of magnitude faster than simulations done in FastSPICE, to predict ADC time progression and to quickly identify the maximum sampling rate that can be used in both redundant and non-redundant cases. We show that redundancy does not always improve sampling rate; instead, the maximum sampling rate depends on the relative magnitudes of different ADC delay components. SPICE simulation in a 65nm CMOS process verifies our behavioral simulation results.

References

[1]
M. Hesener, T. Eichler, A. Hanneberg, D. Herbison, F. Kuttner, and H. Wenske. A 14b 40MS/s Redundant SAR ADC with 480MHz Clock in 0.13¼m CMOS. In IEEE ISSCC Dig. of Tech. Papers, pages 248--249, Feb. 2007.
[2]
F. Kuttner. A 1.2V 10b 20MSample/s Non-Binary Successive Approximation ADC in 0.13¼m CMOS. In IEEE ISSCC Dig. of Tech. Papers, volume 2, pages 136--137, 2002.
[3]
S. Lewis and P. Gray. A Pipelined 5-Msample/s 9-bit Analog-to-Digital Converter. IEEE J. of Solid-State Circuits, 22(6):954--961, Dec. 1987.
[4]
W. Liu, Y. Chang, S.-K. Hsien, B.-W. Chen, Y.-P. Lee, W.-T. Chen, T.-Y. Yang, G.-K. Ma, and Y. Chiu. A 600MS/s 30mW 0.13¼m CMOS ADC array achieving over 60dB SFDR with adaptive digital equalization. In IEEE ISSCC Dig. of Tech. Papers, pages 82--83, Feb. 2009.
[5]
T. Ogawa, H. Kobayashi, M. Hotta, Y. Takahashi, H. San, and N. Takai. SAR ADC Algorithm with Redundancy. In IEEE APCCAS, pages 268--271, Nov. 2008.

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    cover image ACM Conferences
    GLSVLSI '11: Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
    May 2011
    496 pages
    ISBN:9781450306676
    DOI:10.1145/1973009
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 02 May 2011

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    Author Tags

    1. SAR ADCs
    2. digital error correction
    3. redundancy
    4. sampling rate

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    GLSVLSI '11: Great Lakes Symposium on VLSI 2011
    May 2 - 4, 2011
    Lausanne, Switzerland

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