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Analysis of two dimensional image to obtain unique statistical features for developing image recognition techniques using wavelet approach

Published: 25 February 2011 Publication History

Abstract

The Wavelets are mathematical functions. They are used to catch up the data into different frequency components and study the components with a resolution matched to its scale. Wavelets were developed for the fields of mathematics, modern physics, electrical and electronics engineering, and seismic geology. The remarkable developments is being observed in these fields during the last 15 years and have led to many new wavelet applications such as image compression, de-noising, computer vision, automation, automatic visual inspection systems, turbulence, human vision, radar, and earth quake prediction etc. The proposed methodology provides an approach for exploring unique statistical information contained in 2D images, which may further be utilized for developing image recognition techniques.

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www.mathworks.com

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  1. Analysis of two dimensional image to obtain unique statistical features for developing image recognition techniques using wavelet approach

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        cover image ACM Other conferences
        ICWET '11: Proceedings of the International Conference & Workshop on Emerging Trends in Technology
        February 2011
        1385 pages
        ISBN:9781450304498
        DOI:10.1145/1980022
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        Published: 25 February 2011

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        1. DWT
        2. HPF
        3. IDWT
        4. LPF
        5. de-noising
        6. decomposition tree
        7. histogram

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        • (2016)Fruit defect detection based on speeded up robust feature technique2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)10.1109/ICRITO.2016.7785023(590-594)Online publication date: Sep-2016
        • (2015)Uniform segmentation in online signature verification2015 Annual IEEE India Conference (INDICON)10.1109/INDICON.2015.7443278(1-6)Online publication date: Dec-2015
        • (2013)Architecture of Noninvasive Real Time Visual Monitoring System for Dial Type Measuring InstrumentIEEE Sensors Journal10.1109/JSEN.2012.223194013:4(1236-1244)Online publication date: Apr-2013

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