introduction

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Introduction to special section on verification challenges in the concurrent world

Authors:
Sandip Ray

University of Texas at Austin, TX

University of Texas at Austin, TX
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,
Jayanta Bhadra

Freescale Semiconductor Inc., Austin, TX

Freescale Semiconductor Inc., Austin, TX
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,
Magdy S. Abadir

Freescale Semiconductor Inc., Austin, TX

Freescale Semiconductor Inc., Austin, TX
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,
Li-C. Wang

University of California at Santa Barbara, CA

University of California at Santa Barbara, CA
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,
Aarti Gupta

NEC Laboratories America, Inc., Princeton, NJ

NEC Laboratories America, Inc., Princeton, NJ
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ACM Transactions on Design Automation of Electronic Systems Volume 17 Issue 3Article No.: 19pp 1–3https://doi.org/10.1145/2209291.2209292

Published:05 July 2012Publication History

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ACM Transactions on Design Automation of Electronic Systems

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ACM Transactions on Design Automation of Electronic Systems Volume 17, Issue 3
Special section on verification challenges in the concurrent world
June 2012
377 pages
ISSN:1084-4309
EISSN:1557-7309
DOI:10.1145/2209291
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Copyright © 2012 ACM
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]
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Association for Computing Machinery
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ACM Journals for the Design of Smart and Connected Systems
Publication History
- Published: 5 July 2012
Published in todaes Volume 17, Issue 3

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