skip to main content
10.1145/2451916.2451927acmconferencesArticle/Chapter ViewAbstractPublication PagesispdConference Proceedingsconference-collections
research-article

SRAM dynamic stability verification by reachability analysis with consideration of threshold voltage variation

Published: 24 March 2013 Publication History

Abstract

Dynamic stability margin of SRAM is largely suppressed at nano-scale due to not only dynamic noise but also process variation. A novel dynamic stability verification is developed in this paper based on analog reachability analysis for checking SRAM failure. In the presence of mismatch such as threshold voltage variation of all transistors, zonotope-based reachability analysis is deployed to efficiently verify SRAM failure at transistor level. The threshold voltage variation is considered by the modified input range of SRAM. As such, the suppressed stability margin and further failure region can be verified by performing a time-evolved reachability analysis with formed zonotope to distinguish safe and failure regions. One can perform efficient verification of the SRAM dynamic stability without repeated yet time-consuming Monte-Carlo simulations considering variations from all transistors. As demonstrated by numerical experiment results, the developed reachability analysis can accurately verify the SRAM dynamic stability under threshold voltage variations from all transistors. Speedup of more than 400x in runtime can be achieved over the Monte Carlo approach of 500 samples with the similar accuracy.

References

[1]
E. Seevinck, F. J. List, and J. Lohstroh. Static-noise margin analysis of MOS SRAM cells. IEEE Journal of Solid-State Circuits (JSSC), Jan. 1987.
[2]
E. Grossar, M. Stucchi, K. Maex, and W. Dehaene. Read stability and write-ability analysis of SRAM cells for nanometer technologies. IEEE Journal of Solid-State Circuits (JSSC), Nov. 2006.
[3]
S. O. Toh, Z. Guo, and B. Nikolić. Dynamic SRAM stability characterization in 45nm CMOS. In IEEE Symposium on VLSI Circuits (VLSIC), Jun. 2010.
[4]
H. Yu and S. X.-D. Tan. Recent advance in computational prototyping for analysis of high-performance analog/rf ics. In IEEE International Conf. on ASIC (ASICON), Oct. 2009.
[5]
K. Agarwal and S. Nassif. Statistical analysis of SRAM cell stability. In ACM/IEEE Design Automation Conference (DAC), 2006.
[6]
D. E. Khalil, M. Khellah, N. S. Kim, Y. Ismail, T. Karnik, and V. K. De. Accurate estimation of SRAM dynamic stability. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Dec. 2008.
[7]
F. Gong, X. Liu, H. Yu, S. X.-D. Tan, J. Ren, and L. He. A fast non-monte-carlo yield analysis and optimization by stochastic orthogonal polynomials. ACM Transactions on Design Automation of Electronic Systems (TODAES), Jan. 2012.
[8]
S. Srivastava and J. Roychowdhury. Rapid estimation of the probability of SRAM failure due to mos threshold variations. In IEEE Custom Integrated Circuits Conference (CICC), Sep. 2007.
[9]
W. Dong, P. Li, and G. M. Huang. SRAM dynamic stability: theory, variability and analysis. In IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2008.
[10]
A. Girard. Reachability of uncertain linear systems using zonotopes. In Int. conf. on Hybrid Systems: computation and control (HSCC). Springer, 2005.
[11]
M. Althoff. Reachability analysis and its application to the safety assessment of autonomous cars. In PhD Dissertation, TUM, 2010.
[12]
M. Althoff and et.al. Formal verification of phase-locked loops using reachability analysis and continuization. In IEEE Int. Conf. of Computer-aided-design (ICCAD), 2011.
[13]
G. Frehse, B. H. Krogh, and R. A. Rutenbar. Verifying analog oscillator circuits using forward/backward abstraction refinement. In IEEE Design, Automation and Test in Europe (DATE), Mar. 2006.
[14]
Y. Song, H. Fu, H. Yu, and G. Shi. Stable backward reachability correction for pll verification with consideration of environmental noise induced jitter. In IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), Jan. 2013.
[15]
M. Althoff, O. Stursberg, and M. Buss. Reachability analysis of nonlinear systems with uncertain parameters using conservative linearization. In IEEE Conf. on Decision and Ctrl., 2008.
[16]
M. Kvasnica, P. Grieder, and M. Baotić. Multi Parametric

Cited By

View all
  • (2016)A Zonotoped Macromodeling for Eye-Diagram Verification of High-Speed I/O Links With Jitter and Parameter VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.248187335:6(1040-1051)Online publication date: Jun-2016
  • (2014)A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitterProceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design10.5555/2691365.2691506(696-701)Online publication date: 3-Nov-2014
  • (2014)Zonotope-based nonlinear model order reduction for fast performance bound analysis of analog circuits with multiple-interval-valued parameter variationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616621(1-6)Online publication date: 24-Mar-2014
  • Show More Cited By

Index Terms

  1. SRAM dynamic stability verification by reachability analysis with consideration of threshold voltage variation

      Recommendations

      Comments

      Information & Contributors

      Information

      Published In

      cover image ACM Conferences
      ISPD '13: Proceedings of the 2013 ACM International symposium on Physical Design
      March 2013
      194 pages
      ISBN:9781450319546
      DOI:10.1145/2451916
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

      Sponsors

      Publisher

      Association for Computing Machinery

      New York, NY, United States

      Publication History

      Published: 24 March 2013

      Permissions

      Request permissions for this article.

      Check for updates

      Author Tags

      1. reachability analysis
      2. sram reliability
      3. verification

      Qualifiers

      • Research-article

      Conference

      ISPD'13
      Sponsor:
      ISPD'13: International Symposium on Physical Design
      March 24 - 27, 2013
      Nevada, Stateline, USA

      Acceptance Rates

      Overall Acceptance Rate 62 of 172 submissions, 36%

      Upcoming Conference

      ISPD '25
      International Symposium on Physical Design
      March 16 - 19, 2025
      Austin , TX , USA

      Contributors

      Other Metrics

      Bibliometrics & Citations

      Bibliometrics

      Article Metrics

      • Downloads (Last 12 months)8
      • Downloads (Last 6 weeks)0
      Reflects downloads up to 25 Feb 2025

      Other Metrics

      Citations

      Cited By

      View all
      • (2016)A Zonotoped Macromodeling for Eye-Diagram Verification of High-Speed I/O Links With Jitter and Parameter VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.248187335:6(1040-1051)Online publication date: Jun-2016
      • (2014)A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitterProceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design10.5555/2691365.2691506(696-701)Online publication date: 3-Nov-2014
      • (2014)Zonotope-based nonlinear model order reduction for fast performance bound analysis of analog circuits with multiple-interval-valued parameter variationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616621(1-6)Online publication date: 24-Mar-2014
      • (2014)Understanding SRAM Stability via Bifurcation AnalysisACM Transactions on Design Automation of Electronic Systems10.1145/264795719:4(1-25)Online publication date: 29-Aug-2014
      • (2014)Statistical Analysis of Read Static Noise Margin for Near/Sub-Threshold SRAM CellIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2014.232733461:12(3386-3393)Online publication date: Dec-2014
      • (2014)Reachability-Based Robustness Verification and Optimization of SRAM Dynamic Stability Under Process VariationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2014.230470433:4(585-598)Online publication date: 1-Apr-2014
      • (2014)A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitter2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1109/ICCAD.2014.7001428(696-701)Online publication date: Nov-2014
      • (2014)A robustness optimization of SRAM dynamic stability by sensitivity-based reachability analysis2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2014.6742934(461-466)Online publication date: Jan-2014
      • (2013)Performance bound analysis of analog circuits in frequency- and time-domain considering process variationsACM Transactions on Design Automation of Electronic Systems10.1145/253439519:1(1-22)Online publication date: 20-Dec-2013

      View Options

      Login options

      View options

      PDF

      View or Download as a PDF file.

      PDF

      eReader

      View online with eReader.

      eReader

      Figures

      Tables

      Media

      Share

      Share

      Share this Publication link

      Share on social media