research-article

Exploiting program-level masking and error propagation for constrained reliability optimization

Authors:

Muhammad Shafique,

Pau Vilimelis Aceituno,

Jörg HenkelAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 17, Pages 1 - 9

https://doi.org/10.1145/2463209.2488755

Published: 29 May 2013 Publication History

Abstract

Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.

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Cited By

Sahoo SDas AKumar A(2024)Fault Tolerant ArchitecturesHandbook of Computer Architecture10.1007/978-981-97-9314-3_11(277-320)Online publication date: 21-Dec-2024
https://doi.org/10.1007/978-981-97-9314-3_11
Sahoo SDas AKumar A(2023)Fault Tolerant ArchitecturesHandbook of Computer Architecture10.1007/978-981-15-6401-7_11-1(1-44)Online publication date: 17-Feb-2023
https://doi.org/10.1007/978-981-15-6401-7_11-1
Dave SMarchisio AHanif MGuesmi AShrivastava AAlouani IShafique M(2022)Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems2022 IEEE 40th VLSI Test Symposium (VTS)10.1109/VTS52500.2021.9794253(1-14)Online publication date: 25-Apr-2022
https://doi.org/10.1109/VTS52500.2021.9794253
Show More Cited By

Index Terms

Exploiting program-level masking and error propagation for constrained reliability optimization
1. Computer systems organization
2. General and reference
  1. Cross-computing tools and techniques
    1. Reliability

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

Texas, Austin

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Sahoo SDas AKumar A(2024)Fault Tolerant ArchitecturesHandbook of Computer Architecture10.1007/978-981-97-9314-3_11(277-320)Online publication date: 21-Dec-2024
https://doi.org/10.1007/978-981-97-9314-3_11
Sahoo SDas AKumar A(2023)Fault Tolerant ArchitecturesHandbook of Computer Architecture10.1007/978-981-15-6401-7_11-1(1-44)Online publication date: 17-Feb-2023
https://doi.org/10.1007/978-981-15-6401-7_11-1
Dave SMarchisio AHanif MGuesmi AShrivastava AAlouani IShafique M(2022)Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems2022 IEEE 40th VLSI Test Symposium (VTS)10.1109/VTS52500.2021.9794253(1-14)Online publication date: 25-Apr-2022
https://doi.org/10.1109/VTS52500.2021.9794253
Anglada MCanal RAragon JGonzalez A(2021)Fast and Accurate SER Estimation for Large Combinational Blocks in Early Stages of the DesignIEEE Transactions on Sustainable Computing10.1109/TSUSC.2018.28866406:3(427-440)Online publication date: 1-Jul-2021
https://doi.org/10.1109/TSUSC.2018.2886640
Bosio AO'Connor ITraiola MEchavarria JTeich JHanif MShafique MHamdioui SDeveautour BGirard PVirazel ABertels K(2021) Emerging Computing Devices: Challenges and Opportunities for Test and Reliability * 2021 IEEE European Test Symposium (ETS)10.1109/ETS50041.2021.9465409(1-10)Online publication date: 24-May-2021
https://doi.org/10.1109/ETS50041.2021.9465409
Qiu HLin BOlowogemo SRobinson WLimbrick D(2021)Evaluating Soft Error Mitigation Trade-offs During Early Design StagesArchitecture of Computing Systems10.1007/978-3-030-81682-7_14(213-228)Online publication date: 15-Jul-2021
https://doi.org/10.1007/978-3-030-81682-7_14
Hanif MHoang LShafique MCorporaal H(2020)Cross-layer approaches for improving the dependability of deep learning systemsProceedings of the 23th International Workshop on Software and Compilers for Embedded Systems10.1145/3378678.3391884(78-81)Online publication date: 25-May-2020
https://dl.acm.org/doi/10.1145/3378678.3391884
Adikusuma YFang ZHe Y(2020)Fast Construction of Discrete Geodesic GraphsACM Transactions on Graphics10.1145/314456739:2(1-14)Online publication date: 18-Mar-2020
https://dl.acm.org/doi/10.1145/3144567
Hanif MShafique M(2020)Dependable Deep Learning: Towards Cost-Efficient Resilience of Deep Neural Network Accelerators against Soft Errors and Permanent Faults2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)10.1109/IOLTS50870.2020.9159734(1-4)Online publication date: Jul-2020
https://doi.org/10.1109/IOLTS50870.2020.9159734
Mokhtarpour AMonazzah AFarbeh H(2020)PB-IFMC: A Selective Soft Error Protection Method Based on Instruction Fault Masking Capability2020 25th International Computer Conference, Computer Society of Iran (CSICC)10.1109/CSICC49403.2020.9050059(1-9)Online publication date: Jan-2020
https://doi.org/10.1109/CSICC49403.2020.9050059
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