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Automatic design rule correction in presence of multiple grids and track patterns

Authors:

Nitin Salodkar,

Subramanian Rajagopalan,

Sambuddha Bhattacharya,

Shabbir BatterywalaAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 26, Pages 1 - 6

https://doi.org/10.1145/2463209.2488766

Published: 29 May 2013 Publication History

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Abstract

Traditionally, automatic design rule correction (DRC) problem is modeled as a Linear Program (LP) with design rules as difference constraints under minimum perturbation objective. This yields Totally Uni-Modular (TUM) constraint matrices thereby guaranteeing integral grid-compliant solutions with LP solvers. However, advanced technology nodes introduce per-layer grids or discrete tracks that result into non-TUM constraint matrices for the DRC problem. Consequently, LP solvers do not guarantee integral solutions. In this work, we propose a novel formulation using an 'un-rolling' technique. Our formulation guarantees TUM constraint matrices and hence integral multiple grid/track compliant solutions. We demonstrate its efficacy on layouts at advanced nodes.

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Bhattacharya SRajagopalan SBatterywala S(2014)Fixing Double Patterning violations with look-ahead2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2014.6742881(149-154)Online publication date: Jan-2014
https://doi.org/10.1109/ASPDAC.2014.6742881

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Automatic design rule correction in presence of multiple grids and track patterns

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DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGBED: ACM Special Interest Group on Embedded Systems

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Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

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Bhattacharya SRajagopalan SBatterywala S(2014)Fixing Double Patterning violations with look-ahead2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2014.6742881(149-154)Online publication date: Jan-2014
https://doi.org/10.1109/ASPDAC.2014.6742881

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Mining discrete patterns via binary matrix factorization

An Empirical Analysis of Feasibility Checking Algorithms for UTVPI Constraints

Combinatorial optimization model and MIP formulation for the structural analysis of conditional differential-algebraic systems

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