research-article

Predicting future technology performance

Authors:

Craig Alexander,

Ewan TowieAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 32, Pages 1 - 6

https://doi.org/10.1145/2463209.2488774

Published: 29 May 2013 Publication History

Abstract

In this paper we highlight the important role of full-scale 3D Ensemble Monte Carlo (EMC) transport simulations in the performance analysis of contemporary and future decananometer MOSFETs. Considering both electron and hole transport in alternative device structures and materials we demonstrate that conventional drift diffusion (DD) simulations using standard mobility models fail to capture the non-equilibrium transport effects present in these devices, limiting their effectiveness in terms of performing predictive simulation of Si based FinFETs. We clearly demonstrate the capabilities and the power of EMC in evaluating the scaling potential and performance of FinFETs and quantum well transistors employing high mobility materials and the impact that additional scattering sources has on their performance.

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Cited By

Vincent BHathwar RKamon MErvin JSchram TChiarella TDemuynck SBaudot SSiew YKubicek SLitta EChew SMitard J(2020)Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET VehicleIEEE Transactions on Electron Devices10.1109/TED.2020.302752867:12(5374-5380)Online publication date: Dec-2020
https://doi.org/10.1109/TED.2020.3027528
ElGabry OHussien FMohieldin A(2018)Integrated circuit technology characterization and evaluation using automated CAD toolAEU - International Journal of Electronics and Communications10.1016/j.aeue.2018.09.03597(68-78)Online publication date: Dec-2018
https://doi.org/10.1016/j.aeue.2018.09.035
Elgabry OHussien FMohieldin A(2017)An automated CAD tool for rapid technology characterization2017 29th International Conference on Microelectronics (ICM)10.1109/ICM.2017.8268853(1-4)Online publication date: Dec-2017
https://doi.org/10.1109/ICM.2017.8268853
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Index Terms

Predicting future technology performance
1. Hardware

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
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New York, NY, United States

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Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Vincent BHathwar RKamon MErvin JSchram TChiarella TDemuynck SBaudot SSiew YKubicek SLitta EChew SMitard J(2020)Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET VehicleIEEE Transactions on Electron Devices10.1109/TED.2020.302752867:12(5374-5380)Online publication date: Dec-2020
https://doi.org/10.1109/TED.2020.3027528
ElGabry OHussien FMohieldin A(2018)Integrated circuit technology characterization and evaluation using automated CAD toolAEU - International Journal of Electronics and Communications10.1016/j.aeue.2018.09.03597(68-78)Online publication date: Dec-2018
https://doi.org/10.1016/j.aeue.2018.09.035
Elgabry OHussien FMohieldin A(2017)An automated CAD tool for rapid technology characterization2017 29th International Conference on Microelectronics (ICM)10.1109/ICM.2017.8268853(1-4)Online publication date: Dec-2017
https://doi.org/10.1109/ICM.2017.8268853
Asenov ACheng BXingsheng Wang Brown AMillar CAlexander CAmoroso SKuang JNassif S(2015)Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM CooptimizationIEEE Transactions on Electron Devices10.1109/TED.2014.236311762:6(1682-1690)Online publication date: Jun-2015
https://doi.org/10.1109/TED.2014.2363117
Zhang YChen SPeng LChen S(2015)NBTI alleviation on FinFET-made GPUs by utilizing device heterogeneityIntegration, the VLSI Journal10.1016/j.vlsi.2015.04.00351:C(10-20)Online publication date: 1-Sep-2015
https://dl.acm.org/doi/10.1016/j.vlsi.2015.04.003
Marshall A(2014)Thoughts on Possible Future Charge-Based Technologies for Nano-ElectronicsIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2014.233501161:11(3057-3065)Online publication date: Nov-2014
https://doi.org/10.1109/TCSI.2014.2335011
Zhang YChen SPeng LChen S(2014)Mitigating NBTI Degradation on FinFET GPUs through Exploiting Device HeterogeneityProceedings of the 2014 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2014.21(577-582)Online publication date: 9-Jul-2014
https://dl.acm.org/doi/10.1109/ISVLSI.2014.21
Marshall A(2014)Designing with FinFET technology2014 International SoC Design Conference (ISOCC)10.1109/ISOCC.2014.7087569(30-31)Online publication date: Nov-2014
https://doi.org/10.1109/ISOCC.2014.7087569

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