research-article

Reliable on-chip systems in the nano-era: lessons learnt and future trends

Authors:

Muhammad Shafique,

Norbert WehnAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 99, Pages 1 - 10

https://doi.org/10.1145/2463209.2488857

Published: 29 May 2013 Publication History

Abstract

Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. The focus of this paper is on perspective trends from the industrial as well as academic points of view that suggest a way for coping with reliability challenges in upcoming technology nodes.

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Index Terms

Reliable on-chip systems in the nano-era: lessons learnt and future trends
1. Hardware

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

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