research-article

Single-photon image sensors

Authors:

Edoardo Charbon,

Francesco RegazzoniAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 128, Pages 1 - 4

https://doi.org/10.1145/2463209.2488891

Published: 29 May 2013 Publication History

Abstract

The main goal of this paper is to expose the EDA community to the emerging class of circuits operating with single quanta of energy (e.g. photons or electrical carriers). We describe recent developments in the field of single-photon detection and single-photon imaging based on the avalanche effect. Single-photon detection is useful in a number of applications, from time-of-flight based 3D vision systems to fluorescence lifetime imaging microscopy, from low-light cameras to quantum random number generators, from positron emission tomography to time-resolved Raman spectroscopy. These applications have speed and accuracy requirements that conventional systems cannot provide if not at a very high cost. EDA has not yet adapted to the revolution introduced by avalanching devices and, though tools capable of simulating these devices exist, there is little or no capability to do so in a coherent flow, let alone at system level. We challenge CAD designers to fill this gap and prepare them to the circuits of the future, quantum in nature but built in standard CMOS technology.

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Cited By

Goto MImura S(2022)Crystalline Selenium Layer Stacked Image Sensors With Pixel-Parallel A/D Converters Toward Photon CountingIEEE Transactions on Electron Devices10.1109/TED.2021.313111169:6(2894-2899)Online publication date: Jun-2022
https://doi.org/10.1109/TED.2021.3131111

Index Terms

Single-photon image sensors
1. Hardware

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

Texas, Austin

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Cited By

Goto MImura S(2022)Crystalline Selenium Layer Stacked Image Sensors With Pixel-Parallel A/D Converters Toward Photon CountingIEEE Transactions on Electron Devices10.1109/TED.2021.313111169:6(2894-2899)Online publication date: Jun-2022
https://doi.org/10.1109/TED.2021.3131111

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