research-article

New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices

Authors:

Ming-Chang Yang,

Yuan-Hao Chang,

Po-Chun HuangAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 163, Pages 1 - 6

https://doi.org/10.1145/2463209.2488936

Published: 29 May 2013 Publication History

Abstract

As the program/erase (P/E) cycles of flash memory keep decreasing, improving the lifetime/endurance of flash memory has become a fundamental issue in the design of flash devices. This work is motivated by the observation that flash blocks endured the same P/E cycles usually have different bit error rates. In contrast to the existing wear-leveling techniques that try to distribute erases to flash blocks as evenly as possible, we propose an efficient reliability-aware wear-leveling scheme to distribute block erases based on the bit error rates of blocks so as to even out the error rate among flash blocks, to maximize the number of good blocks, and thus to ultimately prolong the lifetime of flash storage devices. The experiments were conducted based on representative realistic workloads to evaluate the efficacy of the proposed scheme, for which the results are very encouraging.

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Cited By

Huang HLim WTu CWu CChang Y(2023)Data Freshness Optimization on Networked Intermittent Systems2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10136912(1-6)Online publication date: Apr-2023
https://doi.org/10.23919/DATE56975.2023.10136912
Wang TTsao CChang YKuo T(2023)Retention-Aware Read Acceleration Strategy for LDPC-Based NAND Flash MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.328932842:12(4597-4605)Online publication date: Dec-2023
https://doi.org/10.1109/TCAD.2023.3289328
Chen YChang YKuo T(2023)DTC: A Drift-Tolerant Coding to Improve the Performance and Energy Efficiency of -Level-Cell Phase-Change MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.324156342:10(3185-3195)Online publication date: Oct-2023
https://doi.org/10.1109/TCAD.2023.3241563
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Index Terms

New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices
1. Software and its engineering
  1. Software organization and properties
    1. Contextual software domains
      1. Operating systems
        Memory management
        Secondary storage

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

Texas, Austin

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Huang HLim WTu CWu CChang Y(2023)Data Freshness Optimization on Networked Intermittent Systems2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10136912(1-6)Online publication date: Apr-2023
https://doi.org/10.23919/DATE56975.2023.10136912
Wang TTsao CChang YKuo T(2023)Retention-Aware Read Acceleration Strategy for LDPC-Based NAND Flash MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.328932842:12(4597-4605)Online publication date: Dec-2023
https://doi.org/10.1109/TCAD.2023.3289328
Chen YChang YKuo T(2023)DTC: A Drift-Tolerant Coding to Improve the Performance and Energy Efficiency of -Level-Cell Phase-Change MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.324156342:10(3185-3195)Online publication date: Oct-2023
https://doi.org/10.1109/TCAD.2023.3241563
Du YGao YHuang SLi Q(2023)LDPC Level Prediction Toward Read Performance of High-Density Flash MemoriesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323884542:10(3264-3274)Online publication date: Oct-2023
https://doi.org/10.1109/TCAD.2023.3238845
Pan YLu ZZhang HZhang HArafin MLiu ZQu G(2023)ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction TechniquesIEEE Transactions on Computers10.1109/TC.2022.321411572:6(1525-1538)Online publication date: 1-Jun-2023
https://doi.org/10.1109/TC.2022.3214115
Chou SChen YChen PChang YYang MKuo TChen YChang Y(2023)FSD: File-related Secure Deletion to Prolong the Lifetime of Solid-State Drives2023 IEEE 12th Non-Volatile Memory Systems and Applications Symposium (NVMSA)10.1109/NVMSA58981.2023.00015(19-24)Online publication date: Aug-2023
https://doi.org/10.1109/NVMSA58981.2023.00015
Hsu TChen YChen YChang YKuo T(2023)REFROM: Responsive, Energy-Efficient Frame Rendering for Mobile Devices2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)10.1109/ISLPED58423.2023.10244482(1-6)Online publication date: 7-Aug-2023
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Chen YChang YKuo T(2022)Drift-tolerant Coding to Enhance the Energy Efficiency of Multi-Level-Cell Phase-Change MemoryProceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design10.1145/3531437.3539701(1-6)Online publication date: 1-Aug-2022
https://dl.acm.org/doi/10.1145/3531437.3539701
Zhang WDong ZZhu Y(2022)EddySuperblock: Improving NAND Flash Efficiency and Lifetime by Endurance-Driven Dynamic Superblock ManagementIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2021.312686230:1(95-107)Online publication date: Jan-2022
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Dharamjeet Chen YChen TKuan YChang Y(2022)LLSM: A Lifetime-Aware Wear-Leveling for LSM-Tree on NAND Flash MemoryIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.319754241:11(3946-3956)Online publication date: Nov-2022
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