research-article

SAW: system-assisted wear leveling on the write endurance of NAND flash devices

Authors:

Weng-Fai WongAuthors Info & Claims

DAC '13: Proceedings of the 50th Annual Design Automation Conference

Article No.: 164, Pages 1 - 9

https://doi.org/10.1145/2463209.2488937

Published: 29 May 2013 Publication History

Abstract

The write endurance of NAND flash memory adversely impacts the lifetime of flash devices. A flash cell is likely to wear out after undergoing excessive program/erase (P/E) flips. Wear leveling is hence employed to spread erase operations as evenly as possible. It is traditionally conducted by the flash translation layer (FTL), a management firmware residing in flash devices. In this paper, we shall propose a novel wear leveling algorithm involving the operating system (OS). We will show that our operating System-Assisted Wear leveling (SAW) algorithm can significantly improve the wear evenness. SAW takes advantage of OS's knowledge about files at a higher level of abstraction, and provides useful hints to the lower-level FTL to accommodate data. A prototype based on a file system and an FTL has been developed to verify the effectiveness of SAW. Experiments show that wear evenness can be improved by as much as 85.0% compared to the state-of-the-art FTL wear leveling schemes.

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Cited By

Li SLi DWu DChen X(2020)NVMFS-IOzoneProceedings of the 13th ACM International Systems and Storage Conference10.1145/3383669.3398281(87-97)Online publication date: 30-May-2020
https://dl.acm.org/doi/10.1145/3383669.3398281
Yu SXiao NDeng MLiu FChen W(2017)Redesign the Memory Allocator for Non-Volatile Main MemoryACM Journal on Emerging Technologies in Computing Systems10.1145/299765113:3(1-26)Online publication date: 14-Apr-2017
https://dl.acm.org/doi/10.1145/2997651
Chen RWang YHu JLiu DShao ZGuan Y(2017)vFlash: Virtualized Flash for Optimizing the I/O Performance in Mobile DevicesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.261888136:7(1203-1214)Online publication date: Jul-2017
https://doi.org/10.1109/TCAD.2016.2618881
Show More Cited By

Index Terms

SAW: system-assisted wear leveling on the write endurance of NAND flash devices
1. Hardware

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cover image ACM Conferences

DAC '13: Proceedings of the 50th Annual Design Automation Conference

May 2013

1285 pages

ISBN:9781450320719

DOI:10.1145/2463209

Copyright © 2013 ACM.

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EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

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Published: 29 May 2013

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DAC '13: The 50th Annual Design Automation Conference 2013

May 29 - June 7, 2013

Texas, Austin

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Li SLi DWu DChen X(2020)NVMFS-IOzoneProceedings of the 13th ACM International Systems and Storage Conference10.1145/3383669.3398281(87-97)Online publication date: 30-May-2020
https://dl.acm.org/doi/10.1145/3383669.3398281
Yu SXiao NDeng MLiu FChen W(2017)Redesign the Memory Allocator for Non-Volatile Main MemoryACM Journal on Emerging Technologies in Computing Systems10.1145/299765113:3(1-26)Online publication date: 14-Apr-2017
https://dl.acm.org/doi/10.1145/2997651
Chen RWang YHu JLiu DShao ZGuan Y(2017)vFlash: Virtualized Flash for Optimizing the I/O Performance in Mobile DevicesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.261888136:7(1203-1214)Online publication date: Jul-2017
https://doi.org/10.1109/TCAD.2016.2618881
Mittal SVetter J(2016)A Survey of Software Techniques for Using Non-Volatile Memories for Storage and Main Memory SystemsIEEE Transactions on Parallel and Distributed Systems10.1109/TPDS.2015.244298027:5(1537-1550)Online publication date: 1-May-2016
https://dl.acm.org/doi/10.1109/TPDS.2015.2442980
Shi LWu KZhao MXue CLiu DSha E(2016)Retention Trimming for Lifetime Improvement of Flash Memory Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.245336935:1(58-71)Online publication date: Jan-2016
https://doi.org/10.1109/TCAD.2015.2453369
Chen RShen ZMa CShao ZGuan Y(2016)NVMRASoftware—Practice & Experience10.1002/spe.237846:9(1263-1284)Online publication date: 1-Sep-2016
https://dl.acm.org/doi/10.1002/spe.2378
Wang CWei QXue MYang JChen C(2015)Data-centric garbage collection for NAND flash devices2015 IEEE Non-Volatile Memory System and Applications Symposium (NVMSA)10.1109/NVMSA.2015.7304360(1-6)Online publication date: Aug-2015
https://doi.org/10.1109/NVMSA.2015.7304360
Wang CWei QYang JChen CXue M(2015)How to be consistent with persistent memory? An evaluation approach2015 IEEE International Conference on Networking, Architecture and Storage (NAS)10.1109/NAS.2015.7255223(186-194)Online publication date: Aug-2015
https://doi.org/10.1109/NAS.2015.7255223
Yi Wang Min Huang Zili Shao Chan HBathen LDutt N(2014)A Reliability-Aware Address Mapping Strategy for NAND Flash Memory Storage SystemsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2014.234792933:11(1623-1631)Online publication date: Nov-2014
https://doi.org/10.1109/TCAD.2014.2347929

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