Andrew B. Kahng
Hyein Lee
ABSTRACT
With reduction of minimum feature size, the minimum implant area (MinIA) constraint is emerging as a new challenge for the physical implementation flow in sub-22nm technology. In particular, the MinIA constraint induces a new problem formulation wherein gate sizing and V_t-swapping must now be linked closely with detailed placement changes. To solve this new problem, we propose heuristic methods that fix MinIA violations and reduce power with gate sizing while minimizing placement perturbation to avoid creating extra timing violations. Compared to recent versions of commercial P&R tools, our methodologies achieve significant reductions (up to 100%) in the number of MinIA violations under timing/power constraints.
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Index Terms
- Minimum implant area-aware gate sizing and placement
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