skip to main content
10.1145/2593069.2593173acmotherconferencesArticle/Chapter ViewAbstractPublication PagesdacConference Proceedingsconference-collections
research-article

On Using Implied Values in EDT-based Test Compression

Published: 01 June 2014 Publication History

Abstract

On-chip test compression has quickly established itself as one of the mainstream design-for-test (DFT) methodologies. It assumes that a tester delivers test patterns in a compressed form, and on-chip decompressors expand them into actual data loaded into scan chains. This paper presents a new and comprehensive method to boost performance of sequential test compression and ATPG operations. The approach is primarily aimed at reducing CPU time associated with generating and compressing test patterns. It prevents ATPG from assigning specified values to many inputs in order to cut down a time-consuming backtracking process needed to resolve conflicts leading to compression aborts. The proposed scheme efficiently combines test compression constraints with ATPG. Experimental results obtained for industrial designs illustrate feasibility of the proposed scheme and are reported herein.

References

[1]
Barnhart, C., Brunkhorst, V., Distler, F., Farnsworth, O., Ferko, A., Keller, B., Scott, D., Koenemann, B., and Onodera, T. 2002. Extending OPMISR beyond 10x scan test efficiency. IEEE Design & Test, 19, (5), 65--73. DOI=http://dx.doi.org/10.1109/MDT.2002.1033794.
[2]
Bayraktaroglu, I. and Orailoglu, A. 2001. Test volume and application time reduction trough scan chain concealment. In Proceedings of the ACM/IEEE Design Automation Conference, DAC'01, ACM, 151--155. DOI= http://dx.doi.org/10.1145/378239.378388.
[3]
Czysz, D., Kassab, M., Lin, X., Mrugalski, G., Rajski, J., and Tyszer, J. 2009. Low power scan operation in test compression environment. IEEE T. Comput. Aid. D., 28, (11), 1742--1755. DOI= http://dx.doi.org/10.1109/TCAD.2009.2030445.
[4]
Dutta, A. and Touba, N.A. 2006. Using limited dependence sequential expansion for decompressing test vectors. In Proceedings of the IEEE International Test Conference. ITC'06. Paper 23.1. DOI= http://dx.doi.org/10.1109/TEST.2006.297662.
[5]
Gherman, V., Wunderlich, H.-J., Vranken, H., Hapke, F., Wittke, M., and Garbers, M. 2004. Efficient pattern mapping for deterministic logic BIST. In Proceedings of the IEEE International Test Conference. ITC'04. 48--56. DOI= http://dx.doi.org/10.1109/TEST.2004.1386936.
[6]
Hakmi, A.-W., Holst, S., Wunderlich, H.-J., Schloffel, J., Hapke, F., and Glowatz, A. 2009. Restrict encoding for mixed-mode BIST. In Proceedings of the IEEE VLSI Test Symposium. VTS'09. 179--184. DOI= http://dx.doi.org/10.1109/VTS.2009.43.
[7]
Hamzaoglu, I. and Patel, J.H. 1999. Reducing test application time for full scan embedded cores. In Proceedings of the Symp. Fault-Tolerant Computing. FTCS'99. 260--267. DOI= http://dx.doi.org/10.1109/FTCS.1999.781060.
[8]
Hellebrand, S., Rajski, J., Tarnick, S., Venkataraman, S., and Courtois, B. 1995. Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers. IEEE T. Comput., 44, (2), 223--233. DOI= http://dx.doi.org/10.1109/12.364534.
[9]
Janicki, J., Kassab, M., Mrugalski, G., Mukherjee, N., Rajski, J., and Tyszer, J. 2012. EDT bandwidth management in SoC designs. IEEE T. Comput. Aid. D., 31, (12), 1894--1907. DOI= http://dx.doi.org/10.1109/TCAD.2012.2205385.
[10]
Kapur, R., Mitra, S., and Williams, T.W. 2008. Historical perspective on scan compression. IEEE Des. Test. Comput., 25, (2), 114--120. DOI= http://dx.doi.org/10.1109/MDT.2008.40.
[11]
Koenemann, B. 1991. LFSR-coded test patterns for scan designs. In Proceedings of the European Test Conference. ETC'91. 237--242.
[12]
Krishna C.V. and Touba, N.A. 2002. Reducing test data volume using LFSR reseeding with seed compression. In Proceedings of the IEEE International Test Conference. ITC'02. 321--330. DOI= http://dx.doi.org/10.1109/TEST.2002.1041775.
[13]
Mitra S. and Kim, K.S. 2006. XPAND: An efficient test stimulus compression technique. IEEE T. Comput., 55, (2), 163--173. DOI= http://dx.doi.org/10.1109/TC.2006.31.
[14]
Mrugalski, G., Mukherjee, N., Rajski, J., Solecki, J., and Tyszer, J. 2012. Low power programmable PRPG with enhanced fault coverage gradient. In Proceedings of the IEEE International Test Conference. ITC'12. Paper 9.3. DOI= http://dx.doi.org/10.1109/TEST.2012.6401559.
[15]
Rajski, J., Tyszer, J., Kassab, M., and Mukherjee, N. 2004. Embedded deterministic test. IEEE T. Comput. Aid. D., 23, (5), 776--792. DOI= http://dx.doi.org/10.1109/TCAD.2004.826558.
[16]
Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Tamarapalli, N., and Qian, J. 2003. Embedded deterministic test for low cost manufacturing. IEEE Des. Test. Comput., 20, (5), 58--66. DOI= http://dx.doi.org/10.1109/MDT.2003.1232257.
[17]
Touba, N.A. 2006. Survey of test vector compression techniques. IEEE Des. Test. Comput., 23, (4), 294--303. DOI= http://dx.doi.org/10.1109/MDT.2006.105.
[18]
Wang, Z. and Chakrabarty, K. 2005. Test data compression for IP embedded cores using selective encoding of scan slices. In Proceedings of the IEEE International Test Conference. ITC'05. 581--590. DOI= http://dx.doi.org/10.1109/TEST.2005.1584019.
[19]
Wohl, P., Waicukauski, J. A., and Finklea, T. 2010. Increasing PRPG-based compression by delayed justification. In Proceedings of the IEEE International Test Conference. ITC'10. Paper 9.1. DOI= http://dx.doi.org/10.1109/TEST.2010.5699226.
[20]
Wohl, P., Waicukauski, J.A., Kapur, R., Ramnath, S., Gizdarski, E., Williams, T.W., and Jaini, P. 2007. Minimizing the impact of scan compression. In Proceedings of the IEEE VLSI Test Symposium. VTS'07. 67--74. DOI= http://dx.doi.org/10.1109/VTS.2007.38.
[21]
Wohl, P., Waicukauski, J. A., Neuveux, F., and Gizdarski, E. 2010. Fully X-tolerant, very high scan compression. In Proceedings of the ACM/IEEE Design Automation Conference, DAC'10, ACM, 362--367. DOI= http://dx.doi.org/10.1145/1837274.1837366.
[22]
Wohl, P., Waicukauski, J.A., Patel, S., DaSilva, F., Williams, T.W., and Kapur, R. 2005. Efficient compression of deterministic patterns into multiple PRPG seeds. In Proceedings of the IEEE International Test Conference. ITC'05. 916--925. DOI= http://dx.doi.org/10.1109/TEST.2005.1584057.

Cited By

View all
  • (2021)New scan compression approach to reduce the test data volumeIET Computers & Digital Techniques10.1049/cdt2.1202015:4(251-262)Online publication date: 18-Mar-2021
  • (2017)A New Paradigm for Synthesis of Linear DecompressorsProceedings of the 54th Annual Design Automation Conference 201710.1145/3061639.3062190(1-6)Online publication date: 18-Jun-2017

Index Terms

  1. On Using Implied Values in EDT-based Test Compression

      Recommendations

      Comments

      Information & Contributors

      Information

      Published In

      cover image ACM Other conferences
      DAC '14: Proceedings of the 51st Annual Design Automation Conference
      June 2014
      1249 pages
      ISBN:9781450327305
      DOI:10.1145/2593069
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

      In-Cooperation

      Publisher

      Association for Computing Machinery

      New York, NY, United States

      Publication History

      Published: 01 June 2014

      Permissions

      Request permissions for this article.

      Check for updates

      Author Tags

      1. Design for testability
      2. scan-based test
      3. test data compression

      Qualifiers

      • Research-article
      • Research
      • Refereed limited

      Conference

      DAC '14

      Acceptance Rates

      Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

      Contributors

      Other Metrics

      Bibliometrics & Citations

      Bibliometrics

      Article Metrics

      • Downloads (Last 12 months)7
      • Downloads (Last 6 weeks)1
      Reflects downloads up to 14 Feb 2025

      Other Metrics

      Citations

      Cited By

      View all
      • (2021)New scan compression approach to reduce the test data volumeIET Computers & Digital Techniques10.1049/cdt2.1202015:4(251-262)Online publication date: 18-Mar-2021
      • (2017)A New Paradigm for Synthesis of Linear DecompressorsProceedings of the 54th Annual Design Automation Conference 201710.1145/3061639.3062190(1-6)Online publication date: 18-Jun-2017

      View Options

      Login options

      View options

      PDF

      View or Download as a PDF file.

      PDF

      eReader

      View online with eReader.

      eReader

      Figures

      Tables

      Media

      Share

      Share

      Share this Publication link

      Share on social media