Cited By
View all- Ebrahimipour SGhavami BRaji M(2019)Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuitsIET Circuits, Devices & Systems10.1049/iet-cds.2018.561613:7(979-987)Online publication date: 22-Oct-2019
- Chu ZXia YWang L(2016)Multi-supply voltage (MSV) driven SoC floorplanning for fast design convergenceIntegration, the VLSI Journal10.1016/j.vlsi.2015.09.00252:C(335-346)Online publication date: 1-Jan-2016