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An efficient technique for computing importance measures in automatic design of dependable embedded systems

Published: 12 October 2014 Publication History

Abstract

Importance measure analysis judges the relative importance of components in a system and reveals how each component contributes to the system reliability. In the design of large and complex systems, importance measure analysis can therefore be employed to guide an optimization tool which design decisions to investigate to gain higher reliability. While previous research has mainly concentrated on developing analytical importance measure techniques, the automatic and frequent computing of importance measures as required in the context of design space exploration has got very few, if any attention. This paper presents a highly efficient technique to compute the reliability and structural importance measures of components of a system. The proposed technique considers the reliability of a system implementation and subsequently analyzes the importance measures of its components based on a state-of-the-art Monte Carlo simulation. The technique can therefore estimate the importance measures of all components concurrently, highly improving the performance of the computation compared, e. g., to the well-known Birnbaum approach by the factor of 2n with n being the number of components. Moreover, we show how this algorithm can be extended to support importance measure analysis in the existence of transient faults which is essential since in future systems, transient faults are expected to cause relatively more failures than permanent faults. We integrated the proposed analysis approach in an existing multi-objective local-search algorithm that is part of an automatic system-level design space exploration which seeks for system implementations with highest reliability at lowest possible cost. Experimental results show that the proposed algorithm performs efficiently with negligible imprecision, even for large real-world examples.

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Cited By

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  • (2020)Uncertainty-Aware Compositional System-Level Reliability AnalysisDependable Embedded Systems10.1007/978-3-030-52017-5_19(457-477)Online publication date: 10-Dec-2020
  • (2019)Efficient Treatment of Uncertainty in System Reliability Analysis using Importance Measures2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)10.1109/DSN.2019.00022(76-87)Online publication date: Jun-2019
  • (2017)On the Boolean extension of the Birnbaum importance to non-coherent systemsReliability Engineering & System Safety10.1016/j.ress.2016.12.013160(191-200)Online publication date: Apr-2017
  • Show More Cited By

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cover image ACM Conferences
CODES '14: Proceedings of the 2014 International Conference on Hardware/Software Codesign and System Synthesis
October 2014
331 pages
ISBN:9781450330510
DOI:10.1145/2656075
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 12 October 2014

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ESWEEK'14
ESWEEK'14: TENTH EMBEDDED SYSTEM WEEK
October 12 - 17, 2014
New Delhi, India

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Cited By

View all
  • (2020)Uncertainty-Aware Compositional System-Level Reliability AnalysisDependable Embedded Systems10.1007/978-3-030-52017-5_19(457-477)Online publication date: 10-Dec-2020
  • (2019)Efficient Treatment of Uncertainty in System Reliability Analysis using Importance Measures2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)10.1109/DSN.2019.00022(76-87)Online publication date: Jun-2019
  • (2017)On the Boolean extension of the Birnbaum importance to non-coherent systemsReliability Engineering & System Safety10.1016/j.ress.2016.12.013160(191-200)Online publication date: Apr-2017
  • (2016)Guiding Genetic Algorithms using importance measures for reliable design of embedded systems2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT.2016.7684069(53-56)Online publication date: Sep-2016

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