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3DIC benefit estimation and implementation guidance from 2DIC implementation

Published: 07 June 2015 Publication History

Abstract

Quantification of three-dimensional integrated circuit (3DIC) benefits over corresponding 2DIC implementation for arbitrary designs remains a critical open problem, largely due to nonexistence of any "golden" 3DIC flow. Actual design and implementation parameters and constraints affect 2DIC and 3DIC final metrics (power, slack, etc.) in highly non-monotonic ways that are difficult for engineers to comprehend and predict. We propose a novel machine learning-based methodology to estimate 3DIC power benefit (i.e., percentage power reduction) based on corresponding golden 2DIC implementation parameters. The resulting 3D Power Estimation (3DPE) models achieve small prediction errors that are bounded by construction. We are the first to perform a novel stress test of our predictive models across a wide range of implementation and design-space parameters. Further, we explore model-guided implementation of designs in 3D to achieve minimum power: that is, our models recommend a most-promising set of implementation parameters and constraints, and also provide a priori estimates of 3D power benefits, based on a given design's post-synthesis and 2D implementation parameters. We achieve ≤10% error in power benefit prediction across various 3DIC designs.

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  • (2019)Power Delivery Pathfinding for Emerging Die-to-Wafer Integration Technology2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE.2019.8715046(842-847)Online publication date: Mar-2019
  • (2019)A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.282155938:4(755-766)Online publication date: Apr-2019
  • (2018)New directions for learning-based IC design tools and methodologiesProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201708(405-410)Online publication date: 22-Jan-2018
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    cover image ACM Conferences
    DAC '15: Proceedings of the 52nd Annual Design Automation Conference
    June 2015
    1204 pages
    ISBN:9781450335201
    DOI:10.1145/2744769
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 07 June 2015

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    Cited By

    View all
    • (2019)Power Delivery Pathfinding for Emerging Die-to-Wafer Integration Technology2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE.2019.8715046(842-847)Online publication date: Mar-2019
    • (2019)A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.282155938:4(755-766)Online publication date: Apr-2019
    • (2018)New directions for learning-based IC design tools and methodologiesProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201708(405-410)Online publication date: 22-Jan-2018
    • (2018)Three-dimensional Floorplan Representations by Using Corner Links and Partial OrderACM Transactions on Design Automation of Electronic Systems10.1145/328917924:1(1-33)Online publication date: 21-Dec-2018
    • (2018)Analysis of Performance Benefits of Multitier Gate-Level Monolithic 3-D Integrated CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2017.276842737:8(1614-1626)Online publication date: Aug-2018
    • (2017)Full Chip Impact Study of Power Delivery Network Designs in Gate-Level Monolithic 3-D ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2016.261637736:6(992-1003)Online publication date: 1-Jun-2017
    • (2017)Revisiting 3DIC benefit with multiple tiersIntegration10.1016/j.vlsi.2017.01.00458(226-235)Online publication date: Jun-2017
    • (2016)Revisiting 3DIC Benefit with Multiple TiersProceedings of the 18th System Level Interconnect Prediction Workshop10.1145/2947357.2947363(1-8)Online publication date: 4-Jun-2016
    • (2016)How to Cope with Slow Transistors in the Top-tier of Monolithic 3D ICsProceedings of the 2016 International Symposium on Low Power Electronics and Design10.1145/2934583.2934643(320-325)Online publication date: 8-Aug-2016
    • (2015)Evolving EDA Beyond its E-RootsProceedings of the IEEE/ACM International Conference on Computer-Aided Design10.5555/2840819.2840855(247-254)Online publication date: 2-Nov-2015

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