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- Yi MBian JNi TJiang CChang HLiang H(2019)A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2018.282155938:4(755-766)Online publication date: Apr-2019
- Kahng AShin Y(2018)New directions for learning-based IC design tools and methodologiesProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201708(405-410)Online publication date: 22-Jan-2018
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