research-article

Capturing True Workload Dependency of BTI-induced Degradation in CPU Components

Authors:

Dimitrios Stamoulis,

Simone Corbetta,

Dimitrios Rodopoulos,

Peter Debacker,

Brett H. Meyer,

Praveen Raghavan,

Dimitrios Soudris,

Francky Catthoor,

Zeljko ZilicAuthors Info & Claims

GLSVLSI '16: Proceedings of the 26th edition on Great Lakes Symposium on VLSI

Pages 373 - 376

https://doi.org/10.1145/2902961.2902992

Published: 18 May 2016 Publication History

Abstract

Atomistic-based approaches accurately model Bias Temperature Instability phenomena, but they suffer from prolonged execution times, preventing their seamless integration in system-level analysis flows. In this paper we present a comprehensive flow that combines the accuracy of Capture Emission Time (CET) maps with the efficiency of the Compact Digital Waveform (CDW) representation. That way, we capture the true workload-dependent BTI-induced degradation of selected CPU components. First, we show that existing works that assume constant stress patterns fail to account for workload dependency leading to fundamental estimation errors. Second, we evaluate the impact of different real workloads on selected CPU sub-blocks from a commercial processor design. To the best of our knowledge, this is the first work that combines atomistic property and true workload-dependency for variability analysis.

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Digital Library

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Cited By

Mishra SWeckx PZografos OLin JSpessot ACatthoor F(2021)Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm2021 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS46558.2021.9405198(1-7)Online publication date: 21-Mar-2021
https://dl.acm.org/doi/10.1109/IRPS46558.2021.9405198
Duch LPeon-Quiros MWeckx PLevisse ABraojos RCatthoor FAtienza D(2020)Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power ProcessorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2020.300347128:10(2122-2133)Online publication date: Oct-2020
https://doi.org/10.1109/TVLSI.2020.3003471
Levisse ARios MPeon-Quiros MAtienza D(2020)Exploration Methodology for BTI-Induced Failures on RRAM-Based Edge AI SystemsICASSP 2020 - 2020 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)10.1109/ICASSP40776.2020.9054524(1549-1552)Online publication date: May-2020
https://doi.org/10.1109/ICASSP40776.2020.9054524
Show More Cited By

Index Terms

Capturing True Workload Dependency of BTI-induced Degradation in CPU Components
1. Hardware
  1. Electronic design automation
  2. Robustness
    1. Hardware reliability
      1. Aging of circuits and systems

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cover image ACM Conferences

GLSVLSI '16: Proceedings of the 26th edition on Great Lakes Symposium on VLSI

May 2016

462 pages

ISBN:9781450342742

DOI:10.1145/2902961

General Chairs:
Ayse K. Coskun
Boston University, USA
,
Martin Margala
University of Massachusetts, Lowell, USA
,
Program Chairs:
Laleh Behjat
University of Calgary, Canada
,
Jie Han
University of Alberta, Canada

Copyright © 2016 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 18 May 2016

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European Commission

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GLSVLSI '16

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GLSVLSI '16: Great Lakes Symposium on VLSI 2016

May 18 - 20, 2016

Massachusetts, Boston, USA

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GLSVLSI '16 Paper Acceptance Rate 50 of 197 submissions, 25%;

Overall Acceptance Rate 312 of 1,156 submissions, 27%

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Cited By

Mishra SWeckx PZografos OLin JSpessot ACatthoor F(2021)Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm2021 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS46558.2021.9405198(1-7)Online publication date: 21-Mar-2021
https://dl.acm.org/doi/10.1109/IRPS46558.2021.9405198
Duch LPeon-Quiros MWeckx PLevisse ABraojos RCatthoor FAtienza D(2020)Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power ProcessorsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2020.300347128:10(2122-2133)Online publication date: Oct-2020
https://doi.org/10.1109/TVLSI.2020.3003471
Levisse ARios MPeon-Quiros MAtienza D(2020)Exploration Methodology for BTI-Induced Failures on RRAM-Based Edge AI SystemsICASSP 2020 - 2020 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)10.1109/ICASSP40776.2020.9054524(1549-1552)Online publication date: May-2020
https://doi.org/10.1109/ICASSP40776.2020.9054524
Sandionigi CHeron O(2019)Estimation of oxide breakdown effects by fault injection2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)10.1109/IOLTS.2019.8854441(269-274)Online publication date: Jul-2019
https://doi.org/10.1109/IOLTS.2019.8854441
Cappelle HNoltsis MCorbetta SCatthoor F(2018)Improving Robustness of a Real-Time Spectrum Sensing Application with the HARPA Run-Time EngineHarnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms10.1007/978-3-319-91962-1_7(151-164)Online publication date: 24-Oct-2018
https://doi.org/10.1007/978-3-319-91962-1_7
Zompakis NNoltsis MNdreu LHadjilambrou ZEnglezakis PNikolaou PPortero ALibutti SMassari GSassi FBacchini ANicopoulos CSazeides YVavrik RGolasowski MSevcik JVondrak VCatthoor FFornaciari WSoudris D(2017)HARPAProceedings of the Conference on Design, Automation & Test in Europe10.5555/3130379.3130402(97-102)Online publication date: 27-Mar-2017
https://dl.acm.org/doi/10.5555/3130379.3130402
Zompakis NNoltsis MNdreu LHadjilambrou ZEnglezakis PNikolaou PPortero ALibutti SMassari GSassi FBacchini ANicopoulos CSazeides YVavrik RGolasowski MSevcik JVondrak VCatthoor FFornaciari WSoudris D(2017)HARPA: Tackling physically induced performance variabilityDesign, Automation & Test in Europe Conference & Exhibition (DATE), 201710.23919/DATE.2017.7926965(97-102)Online publication date: Mar-2017
https://doi.org/10.23919/DATE.2017.7926965
Cai EStamoulis DMarculescu D(2016)Exploring aging deceleration in FinFET-based multi-core systems2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1145/2966986.2967039(1-8)Online publication date: 7-Nov-2016
https://dl.acm.org/doi/10.1145/2966986.2967039
Stamoulis DMarculescu D(2016)Can We Guarantee Performance Requirements under Workload and Process Variations?Proceedings of the 2016 International Symposium on Low Power Electronics and Design10.1145/2934583.2934641(308-313)Online publication date: 8-Aug-2016
https://dl.acm.org/doi/10.1145/2934583.2934641

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