Cited By
View all- Yin SGuo SLi HLi CChen RLi XJiang H(2025)Line-Level Defect Prediction by Capturing Code Contexts With Graph Convolutional NetworksIEEE Transactions on Software Engineering10.1109/TSE.2024.350372351:1(172-191)Online publication date: Jan-2025
- Sun YWu FWu DJing XSun Y(2025)Multi-view learning based on product and process metrics for software defect predictionApplied Intelligence10.1007/s10489-025-06288-655:6Online publication date: 4-Feb-2025
- Shaikh MTunio IKhan JJung Y(2024)Effort-Aware Fault-Proneness Prediction Using Non-API-Based Package-Modularization MetricsMathematics10.3390/math1214220112:14(2201)Online publication date: 13-Jul-2024
- Show More Cited By