research-article

Software-based SIC pair Generation

Authors:

I. Voyiatzis,

C. Efstathiou,

K. PatriarcheasAuthors Info & Claims

PCI '16: Proceedings of the 20th Pan-Hellenic Conference on Informatics

Article No.: 59, Pages 1 - 6

https://doi.org/10.1145/3003733.3003803

Published: 10 November 2016 Publication History

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Abstract

The detection of robustly detectable sequential faults has been extensively studied. A number of researchers have provided theoretical as well as experimental results designating that the application of Single Input Change (SIC) pairs of test patterns results in favorable results for sequential fault testing. In this paper a software-based implementation for the generation of SIC pairs is presented.

References

[1]

Wadsack R. L., "Fault Modeling and logic simulation of CMOS and MOS integrated circuits", Bell Syst. Tech. J., vol. 57, no. 5, pp. 1449--1474, May-June 1987.

Crossref

Google Scholar

[2]

Woods M.H., "MOS VSI Reliability and Yield Trends", Proceedings of the IEEE, vol. 74, no. 12, Dec. 1986, pp. 1715--1729.

Crossref

Google Scholar

[3]

Smith G. L., "Model for Delay Faults based Upon Paths", IEEE International Test Conference, pp. 309--314, 1984.

Google Scholar

[4]

Wang W., Gupta S., "Weighted Random Robust Path Delay Testing of Synthesized Multilevel Circuits", IEEE VLSI Test Symposium, pp. 291--297, 1994.

Crossref

Google Scholar

[5]

Gizdarski E., "Detection of Delay Faults in Memory Address Decoders", Journal of Electronic Testing, Volume 16, Number 4, August 2000, pp. 381--387.

Digital Library

Google Scholar

[6]

I. Voyiatzis, D. Gizopoulos, A. Paschalis, Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (Volume:13, Issue: 9), Page(s): 1079--1086, Sept. 2005.

Digital Library

Google Scholar

[7]

Gupta S., Rajski J., Tyszer J., "Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns", IEEE Transactions on Computers, vol 45, no.8, pp. 939--949, August, 1996.

Digital Library

Google Scholar

[8]

J. Rajski, J. Tyszer, "Recursive Pseudoexhaustive Test Pattern Generation", IEEE Transactions on Computers, vol. 42, no. 12, December 1993, pp. 1517--1521.

Digital Library

Google Scholar

[9]

Voyiatzis I., Paschalis A., Nikolos D., Halatsis C., "Exhaustive and Pseudoexhaustive Built-In Two-Pattern Generation for Datapaths", IEEE International On-Line Test Workshop, 1998.

Google Scholar

Software-based SIC pair Generation
1. Hardware

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Published In

PCI '16: Proceedings of the 20th Pan-Hellenic Conference on Informatics

November 2016

449 pages

ISBN:9781450347891

DOI:10.1145/3003733

© 2016 Association for Computing Machinery. ACM acknowledges that this contribution was authored or co-authored by an employee, contractor or affiliate of a national government. As such, the Government retains a nonexclusive, royalty-free right to publish or reproduce this article, or to allow others to do so, for Government purposes only.

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Greek Com Soc: Greek Computer Society
TEI: Technological Educational Institution of Athens

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Association for Computing Machinery

New York, NY, United States

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Published: 10 November 2016

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PCI '16: 20th Pan-Hellenic Conference on Informatics

November 10 - 12, 2016

Patras, Greece

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Decision Aided Hybrid MMSE/SIC Multiuser Detection: Structure and AME Performance Analysis*This work is supported in part by National Science Council of R.O.C. under contract number NSC92-2219-E-011-006.

Pair and swap: An approach to graceful degradation for dependable chip multiprocessors

Critical Fault-Based Pattern Generation for Screening SDDs

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