research-article

Public Access

Flash Drive Lifespan is a Problem

Authors:

Donald E. Porter,

Dan TsafrirAuthors Info & Claims

HotOS '17: Proceedings of the 16th Workshop on Hot Topics in Operating Systems

Pages 42 - 49

https://doi.org/10.1145/3102980.3102988

Published: 07 May 2017 Publication History

Abstract

When flash was introduced, wear-out was a known problem. Over time, a number of techniques have been developed to estimate the expected number of program/erase cycles under typical usage patterns, and sufficiently over-provision the cells such that the device meets its expected lifespan, even if individual cells fail. This paper started as a simple experiment: measuring whether the lifespan of flash devices in smartphones and other mobile devices, match the estimates. To our surprise, we find that, in a matter of days, simple, unprivileged applications can render the drive of several smartphones (and thus, the phone) inoperable. This result is concerning, as it means that installing malicious or poorly-written software could destroy the device itself. We experimentally demonstrate the problem, discuss reasons why it occurs, and consider potential solutions.

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Cited By

Yan PZhu BShen ZShu JYang J(2024)ZUFS: Enhancing Stability and Endurance in Mobile Devices with Integrated Zoned Namespaces in Universal Flash Storage2024 IEEE 24th International Symposium on Cluster, Cloud and Internet Computing (CCGrid)10.1109/CCGrid59990.2024.00073(609-615)Online publication date: 6-May-2024
https://doi.org/10.1109/CCGrid59990.2024.00073
Jiao ZBhimani JKim BAnwar ASkourtis DKannan SMa X(2022)Wear leveling in SSDs considered harmfulProceedings of the 14th ACM Workshop on Hot Topics in Storage and File Systems10.1145/3538643.3539750(72-78)Online publication date: 27-Jun-2022
https://dl.acm.org/doi/10.1145/3538643.3539750
Bougioukou EVarsamou MToulgaridis NAntonakopoulos T(2020)A Real-Time Non-Volatile Memory Analyzer and its Use on the Evaluation of Storage Devices based on NAND Flash Memories2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)10.1109/I2MTC43012.2020.9128931(1-6)Online publication date: 25-May-2020
https://dl.acm.org/doi/10.1109/I2MTC43012.2020.9128931
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Flash Drive Lifespan *is* a Problem

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cover image ACM Conferences

HotOS '17: Proceedings of the 16th Workshop on Hot Topics in Operating Systems

May 2017

185 pages

ISBN:9781450350686

DOI:10.1145/3102980

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Cited By

Yan PZhu BShen ZShu JYang J(2024)ZUFS: Enhancing Stability and Endurance in Mobile Devices with Integrated Zoned Namespaces in Universal Flash Storage2024 IEEE 24th International Symposium on Cluster, Cloud and Internet Computing (CCGrid)10.1109/CCGrid59990.2024.00073(609-615)Online publication date: 6-May-2024
https://doi.org/10.1109/CCGrid59990.2024.00073
Jiao ZBhimani JKim BAnwar ASkourtis DKannan SMa X(2022)Wear leveling in SSDs considered harmfulProceedings of the 14th ACM Workshop on Hot Topics in Storage and File Systems10.1145/3538643.3539750(72-78)Online publication date: 27-Jun-2022
https://dl.acm.org/doi/10.1145/3538643.3539750
Bougioukou EVarsamou MToulgaridis NAntonakopoulos T(2020)A Real-Time Non-Volatile Memory Analyzer and its Use on the Evaluation of Storage Devices based on NAND Flash Memories2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)10.1109/I2MTC43012.2020.9128931(1-6)Online publication date: 25-May-2020
https://dl.acm.org/doi/10.1109/I2MTC43012.2020.9128931
Zhang TZuck APorter DTsafrir DSong JKim MLane NBalan R(2019)Apps Can Quickly Destroy Your Mobile's FlashProceedings of the 17th Annual International Conference on Mobile Systems, Applications, and Services10.1145/3307334.3326108(207-221)Online publication date: 12-Jun-2019
https://dl.acm.org/doi/10.1145/3307334.3326108

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