Lahcen Ait Benali
ABSTRACT
In this paper, a new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bi-layer material sample is placed in an X-band short-circuited rectangular waveguide WR90. Expression for the S11 parameter of the bi-layer dielectric material as a function of complex permittivity of each layer is developed. To estimate the complex permittivity of each layer's dielectric material; the square sums of errors between the simulated with the HFSS software and calculated S-parameter are minimized using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon and Teflon-Plexiglas are determined at the X-band frequencies.
- J.Terhzaz, H.Ammor and all, "Determination of the complex permittivity of dielectric materials at microwave frequency using rectangular waveguide measurements and Newton-Raphson method", EDP Sciences, Materiaux & Techniques Vol.94, pp. 227--233, 2006.Google Scholar
Cross Ref
- H. Elmajid, Jaouad Terhzaz, Hassan Ammor, « Analysis of discontinuities created by a composite multilayer material in a rectangular waveguide using mode matching technique » IEEE xplore, pp 1479--1483, 2014.Google Scholar
- Hasar, U. C., O. Simsek, "An accurate complex permittivity method for thin dielectric materials", Progress in Electromagnetic Research. 91, pp. 123--138, (2009).Google ScholarCross Ref
- J. Nelder and R. Mead, A simplex method for function minimization., Computer Journal.vol. 7, pp. 308--313, (1965).Google ScholarCross Ref
- J. Terhzaz "Determination of the complex permittivity of dielectric materials at microwave frequency using rectangular waveguide measurements and Newton-Raphson method", Matériaux & Techniques 94, 227--233 (2006)Google ScholarCross Ref
- H. Elmajid "A New Method to Determine the Complex Permittivity and Complex Permeability of Dielectric Materials at X-Band Frequencies" International Journal of Microwave and Optical Technology, Vol.10, No 1, january 2015Google Scholar
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