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View all- Jeong YChae J(2024)Per-DFE Offset Measurement and Cancellation of Weighted-VREF-Based Loop-Unrolled DFE for Memory InterfacesIEEE Transactions on Instrumentation and Measurement10.1109/TIM.2024.348813573(1-8)Online publication date: 2024
- Chae J(2023)Design of Clocked Comparator Preventing Bit Errors to Improve Reliability of Low-Speed DRAM MeasurementIEEE Transactions on Instrumentation and Measurement10.1109/TIM.2023.331868772(1-10)Online publication date: 2023