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- Li J(2023)Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT59622.2023.10313537(1-6)Online publication date: 3-Oct-2023
- Li J(2022)Testing and Reliability of Computing-In Memories: Solutions and Challenges2022 IEEE International Test Conference in Asia (ITC-Asia)10.1109/ITCAsia55616.2022.00020(55-60)Online publication date: Aug-2022