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Testing stuck-open faults of priority address encoder in content addressable memories

Published: 21 January 2019 Publication History

Abstract

Content addressable memory (CAM) is widely used in the systems with the need of parallel search. The testing of CAM is more difficult than that of random access memory (RAM) due to the complicated function of CAM. Similar to the testing of RAM, the testing of CAM should cover the cell array and peripheral circuits. In this paper, we propose a March-like test, March-PCL, for detecting the stuck-open faults (SOFs) of the priority address encoder of CAMs. As the best of our knowledge, this is the first word to discuss the testing of SOFs of the priority address encoder of CAMs. The March-PCL requires 4N Write and 4N Compare operations to cover 100% SOFs.

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  • (2024)A Reduced overhead Accumulator-based BIST scheme for Two-pattern generation2024 9th South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference (SEEDA-CECNSM)10.1109/SEEDA-CECNSM63478.2024.00012(13-17)Online publication date: 20-Sep-2024
  • (2023)Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT59622.2023.10313537(1-6)Online publication date: 3-Oct-2023
  • (2022)Testing and Reliability of Computing-In Memories: Solutions and Challenges2022 IEEE International Test Conference in Asia (ITC-Asia)10.1109/ITCAsia55616.2022.00020(55-60)Online publication date: Aug-2022

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    cover image ACM Conferences
    ASPDAC '19: Proceedings of the 24th Asia and South Pacific Design Automation Conference
    January 2019
    794 pages
    ISBN:9781450360074
    DOI:10.1145/3287624
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    Published: 21 January 2019

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    Author Tags

    1. comparison faults
    2. content addressable memories
    3. memory testing
    4. priority encoder faults

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    View all
    • (2024)A Reduced overhead Accumulator-based BIST scheme for Two-pattern generation2024 9th South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference (SEEDA-CECNSM)10.1109/SEEDA-CECNSM63478.2024.00012(13-17)Online publication date: 20-Sep-2024
    • (2023)Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT59622.2023.10313537(1-6)Online publication date: 3-Oct-2023
    • (2022)Testing and Reliability of Computing-In Memories: Solutions and Challenges2022 IEEE International Test Conference in Asia (ITC-Asia)10.1109/ITCAsia55616.2022.00020(55-60)Online publication date: Aug-2022

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