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A Contrast Pre-adjusted Defect Detection of Strip Steel Surface by Total Variation-based Image Decomposition

Published: 08 December 2018 Publication History

Abstract

Automatic vision-based defect detection on the strip steel surface is a challenging task due to miscellaneous patterns of defects, low contrast of the image. Traditional methods mainly distinguish the defects from the background by analyzing textural information. In this paper, a novel defect detection method by total variation-based image decomposition is developed to extract abnormal region from repetitive texture. Specially, a contrast-adjusted step is designed for the image decomposition, which can compress the dynamic range of the background brightness and enhance the contrast effectively. Furthermore, the histogram of the enhanced image shows multi-peak characteristics, which greatly contributes to the subsequent image decomposition. Next, the total variation-based image decomposition is developed for the contrast-adjusted image to extract structural map. Finally, the abnormal regions can be located only by an adaptive threshold in the structural map. The proposed method can be extended to detect the defects on other regularly textured surface, even under the low signal-to-noise ratio condition. The experiments show that the performance of the proposed algorithm is better than the state-of-art algorithms.

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  1. A Contrast Pre-adjusted Defect Detection of Strip Steel Surface by Total Variation-based Image Decomposition

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    CSAI '18: Proceedings of the 2018 2nd International Conference on Computer Science and Artificial Intelligence
    December 2018
    641 pages
    ISBN:9781450366069
    DOI:10.1145/3297156
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    • Shenzhen University: Shenzhen University

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    Published: 08 December 2018

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    Author Tags

    1. Contrast enhancement
    2. Defect detection
    3. Image decomposition
    4. Low SNR

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