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Visualization of Feature Locations with the Tool FeatureDashboard

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Published:09 September 2019Publication History

ABSTRACT

Modern development processes and issue trackers often use the notion of features to manage a software system. Features allow communicating system characteristics across stakeholders and keeping an overview understanding---especially important for systems that exist in many different variants. However, maintaining, evolving or reusing features (e.g., propagating across variants, or integrating into a platform) requires knowing their locations to prevent extensive feature-location recovery. We advocate the use of embedded annotations, added directly into software assets by the developers during development. To support this process and provide immediate benefits to developers when using such annotations, we present the open-source tool FeatureDashboard. It extracts and visualizes features and their locations using different views and metrics. As such, it encourages developers recording features and their locations early, to prevent feature identification and location efforts, as well as it supports system comprehension.

References

  1. Hadil Abukwaik, Andreas Burger, Berima Andam, and Thorsten Berger. 2018. Semi-Automated Feature Traceability with Embedded Annotations. In ICSME.Google ScholarGoogle Scholar
  2. Berima Andam, Andreas Burger, Thorsten Berger, and Michel RV Chaudron. 2017. Florida: Feature location dashboard for extracting and visualizing feature traces. In VaMoS. Google ScholarGoogle ScholarDigital LibraryDigital Library
  3. Kacper Bak, Zinovy Diskin, Michal Antkiewicz, Krzysztof Czarnecki, and Andrzej Wasowski. 2016. Clafer: unifying class and feature modeling. Software & Systems Modeling 15, 3 (2016), 811--845. Google ScholarGoogle ScholarDigital LibraryDigital Library
  4. B. Behringer, J. Palz, and T. Berger. 2017. PEoPL: Projectional Editing of Product Lines. In ICSE. Google ScholarGoogle ScholarDigital LibraryDigital Library
  5. Thorsten Berger, Daniela Lettner, Julia Rubin, Paul Grünbacher, Adeline Silva, Martin Becker, Marsha Chechik, and Krzysztof Czarnecki. 2015. What is a Feature? A Qualitative Study of Features in Industrial Software Product Lines. In SPLC. Google ScholarGoogle ScholarDigital LibraryDigital Library
  6. Thorsten Berger, Divya Nair, Ralf Rublack, Joanne M. Atlee, Krzysztof Czarnecki, and Andrzej Wasowski. 2014. Three Cases of Feature-Based Variability Modeling in Industry. In MODELS.Google ScholarGoogle Scholar
  7. Thorsten Berger, Ralf Rublack, Divya Nair, Joanne M. Atlee, Martin Becker, Krzysztof Czarnecki, and Andrzej Wąsowski. 2013. A Survey of Variability Modeling in Industrial Practice. In VaMoS. Google ScholarGoogle ScholarDigital LibraryDigital Library
  8. John Businge, Openja Moses, Sarah Nadi, Engineer Bainomugisha, and Thorsten Berger. 2018. Clone-Based Variability Management in the Android Ecosystem. In ICSME.Google ScholarGoogle Scholar
  9. Bogdan Dit, Meghan Revelle, Malcom Gethers, and Denys Poshyvanyk. 2013. Feature location in source code: a taxonomy and survey. Journal of software: Evolution and Process 25, 1 (2013), 53--95.Google ScholarGoogle ScholarCross RefCross Ref
  10. Yael Dubinsky, Julia Rubin, Thorsten Berger, Slawomir Duszynski, Martin Becker, and Krzysztof Czarnecki. 2013. An Exploratory Study of Cloning in Industrial Software Product Lines. In CSMR. Google ScholarGoogle ScholarDigital LibraryDigital Library
  11. Janet Feigenspan, Maria Papendieck, Christian Kästner, Mathias Frisch, and Raimund Dachselt. 2011. FeatureCommander: colorful# ifdef world.. In SPLC Workshops. 48. Google ScholarGoogle ScholarDigital LibraryDigital Library
  12. Wenbin Ji, Thorsten Berger, Michal Antkiewicz, and Krzysztof Czarnecki. 2015. Maintaining feature traceability with embedded annotations. In SPLC. Google ScholarGoogle ScholarDigital LibraryDigital Library
  13. Christian Kästner, Salvador Trujillo, and Sven Apel. 2008. Visualizing Software Product Line Variabilities in Source Code.. In SPLC (2). 303--312.Google ScholarGoogle Scholar
  14. Jacob Krueger, Gul Calikli, Thorsten Berger, Thomas Leich, and Gunter Saake. 2019. Effects of Explicit Feature Traceability on Program Comprehension. In FSE.Google ScholarGoogle Scholar
  15. Jacob Krüger, Thorsten Berger, and Thomas Leich. 2018. Features and How to Find Them: A Survey of Manual Feature Location. Taylor & Francis Group, LLC/CRC Press.Google ScholarGoogle Scholar
  16. Salome Maro and Jan-Philipp Steghöfer. 2016. Capra: A Configurable and Extendable Traceability Management Tool. In RE.Google ScholarGoogle Scholar
  17. Mukelabai Mukelabai, Benjamin Behringer, Moritz Fey, Jochen Palz, Jacob Krüger, and Thorsten Berger. 2018. Multi-View Editing of Software Product Lines with PEoPL. In 40th International Conference on Software Engineering (ICSE), Demonstrations Track. Google ScholarGoogle ScholarDigital LibraryDigital Library
  18. Leonardo Passos, Jesus Padilla, Thorsten Berger, Sven Apel, Krzysztof Czarnecki, and Marco Tulio Valente. 2015. Feature Scattering in the Large: A Longitudinal Study of Linux Kernel Device Drivers. In MODULARITY. Google ScholarGoogle ScholarDigital LibraryDigital Library
  19. Leonardo Passos, Rodrigo Queiroz, Mukelabai Mukelabai, Thorsten Berger, Sven Apel, Krzysztof Czarnecki, and Jesus Padilla. 2018. A Study of Feature Scattering in the Linux Kernel. IEEE Transactions on Software Engineering (2018). Preprint.Google ScholarGoogle Scholar
  20. Julia Rubin and Marsha Chechik. 2013. A survey of feature location techniques. In Domain Engineering.Google ScholarGoogle Scholar
  21. Michael Stengel, Mathias Frisch, Sven Apel, Janet Feigenspan, Christian Kastner, and Raimund Dachselt. 2011. View infinity: a zoomable interface for featureoriented software development. In ICSE. Google ScholarGoogle ScholarDigital LibraryDigital Library

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        cover image ACM Other conferences
        SPLC '19: Proceedings of the 23rd International Systems and Software Product Line Conference - Volume B
        September 2019
        252 pages
        ISBN:9781450366687
        DOI:10.1145/3307630

        Copyright © 2019 ACM

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        New York, NY, United States

        Publication History

        • Published: 9 September 2019

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