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Extended Abstract of "Spectrum-Based Fault Localization in Software Product Lines"

Published: 09 September 2019 Publication History

Abstract

Testing Software Product Lines (SPLs) is a challenging approach due to the huge number of products under test. Most of the SPL testing approaches have proposed novel ideas to make verification and validation activities cost-effective. However, after executing tests and detecting faults, debugging is a cumbersome and time consuming task. In our article [1], we proposed a debugging approach to localize bugs in SPLs that works in two steps: first, feature sets of the SPL are ranked according to their suspiciousness (i.e., likelihood of being faulty) by applying spectrum-based fault localization techniques. In a second step, a fault isolation algorithm is used to generate valid products of minimum size containing the most suspicious features, helping to isolate the cause of failures.

References

[1]
Aitor Arrieta, Sergio Segura, Urtzi Markiegi, Goiuria Sagardui, and Leire Etxeberria. Spectrum-based fault localization in software product lines. Information and Software Technology, 100:18--31, 2018.
[2]
W Eric Wong, Ruizhi Gao, Yihao Li, Rui Abreu, and Franz Wotawa. A survey on software fault localization. IEEE Transactions on Software Engineering, 42(8):707--740, 2016.

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  1. Extended Abstract of "Spectrum-Based Fault Localization in Software Product Lines"

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    SPLC '19: Proceedings of the 23rd International Systems and Software Product Line Conference - Volume A
    September 2019
    356 pages
    ISBN:9781450371384
    DOI:10.1145/3336294
    Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 09 September 2019

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    Author Tags

    1. debugging
    2. software product lines
    3. spectrum-based fault localization

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