research-article

Storage Reliability Evaluation based on Competing Risks of Degradation Failure and Random Failure for Missiles

Authors:

Xinjie ChenAuthors Info & Claims

WSSE '20: Proceedings of the 2nd World Symposium on Software Engineering

Pages 278 - 282

https://doi.org/10.1145/3425329.3425382

Published: 11 November 2020 Publication History

Abstract

Storage reliability is an important technical index of missiles. And missile failures as the competition results of multi-components degradation failure and random failure, which is utilized to construct storage reliability evaluation model in this paper. The Mahalanobis distance is introduced to evaluate healthy states of missiles. Then Inverse Gaussian process is selected in healthy states degradation modeling. With an assumption that the probability of random failure depends on the degradation of healthy states of missiles, a storage reliability evaluation model of missiles is constructed. A numerical example with a set of missiles in storage is introduced to illustrate the rationality and engineering applicability of the method proposed in this paper.

References

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Ye, Z.-S., Chen, L.-P., Tang, L. C., & Xie, M. 2014. Accelerated degradation test planning using the inverse Gaussian process. IEEE Transactions on Reliability, 63(3): 750--763. DOI= https://doi.org/10.1109/tr.2014.2315773.

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Cited By

Chang MCoolen FCoolen-Maturi THuang X(2024)A generalized system reliability model based on survival signature and multiple competing failure processesJournal of Computational and Applied Mathematics10.1016/j.cam.2023.115364435:COnline publication date: 1-Jan-2024
https://dl.acm.org/doi/10.1016/j.cam.2023.115364

Index Terms

Storage Reliability Evaluation based on Competing Risks of Degradation Failure and Random Failure for Missiles
1. Mathematics of computing
  1. Probability and statistics
    1. Probabilistic algorithms

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WSSE '20: Proceedings of the 2nd World Symposium on Software Engineering

September 2020

329 pages

ISBN:9781450387873

DOI:10.1145/3425329

Copyright © 2020 ACM.

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Wuhan Univ.: Wuhan University, China
University of Electronic Science and Technology of China: University of Electronic Science and Technology of China

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 11 November 2020

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WSSE 2020: 2020 The 2nd World Symposium on Software Engineering

September 25 - 27, 2020

Chengdu, China

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Cited By

Chang MCoolen FCoolen-Maturi THuang X(2024)A generalized system reliability model based on survival signature and multiple competing failure processesJournal of Computational and Applied Mathematics10.1016/j.cam.2023.115364435:COnline publication date: 1-Jan-2024
https://dl.acm.org/doi/10.1016/j.cam.2023.115364

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