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Diagnosis for Reconfigurable Single-Electron Transistor Arrays with a More Generalized Defect Model

Published: 21 January 2021 Publication History

Abstract

Singe-Electron Transistor (SET) is considered as a promising candidate of low-power devices for replacement or co-existence with Complementary Metal-Oxide-Semiconductor (CMOS) transistors/circuits. In this work, we propose a diagnosis approach for SET array under a more generalized defect model. With the more generalized defect model, the diagnosis approach will become more practical but complicated. We conducted experiments on a set of SET arrays with different dimensions and defect rates. The experimental results show that our approach only has 3.8% false-negative rate and 0.7% misjudged-category rate on average without reporting any false-positive edge when the defect rate is 4%. Therefore, the proposed diagnosis approach can diagnose the defective SET arrays and elevate the reliability of the SET arrays in the synthesis flow.

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    cover image ACM Journal on Emerging Technologies in Computing Systems
    ACM Journal on Emerging Technologies in Computing Systems  Volume 17, Issue 2
    Hardware and Algorithms for Efficient Machine Learning
    April 2021
    360 pages
    ISSN:1550-4832
    EISSN:1550-4840
    DOI:10.1145/3446841
    • Editor:
    • Ramesh Karri
    Issue’s Table of Contents
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 21 January 2021
    Accepted: 01 December 2020
    Revised: 01 August 2020
    Received: 01 March 2020
    Published in JETC Volume 17, Issue 2

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    Author Tags

    1. Single-electron transistor array
    2. clustering-defect
    3. diagnosis
    4. generalized defect model

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    • (2022)SPSRec: An Efficient Signal Phase Recommendation for Signalized Intersections With GAN and Decision-Tree ModelIEEE Transactions on Intelligent Transportation Systems10.1109/TITS.2022.320781524:12(15601-15612)Online publication date: 28-Sep-2022

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