Analysis of Intelligent application software testing and evaluation technology
Authors: 
Yingbei Niu, Zhenyu Wu, Feng LiangAuthors Info & Claims
Yingbei Niu, Zhenyu Wu, Feng LiangAuthors Info & ClaimsArticle No.: 176, Pages 1 - 4
Abstract
Aiming at the problem of intelligent application software evaluation, this paper analyzes several common defect location technologies: defect location technology based on coverage, defect location technology based on program slice, defect location technology based on model and algorithm evaluation method. Aiming at the deep learning algorithm model based on convolutional neural network commonly used in intelligent application software, the corresponding test method is proposed. This paper compares the advantages of intelligent application software testing with traditional software testing, and discusses the challenges and development direction of intelligent application software testing in the future.
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- Analysis of Intelligent application software testing and evaluation technology
Index terms have been assigned to the content through auto-classification.
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Published In
January 2021
1142 pages
ISBN:9781450389570
DOI:10.1145/3448734
Copyright © 2021 ACM.
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Association for Computing Machinery
New York, NY, United States
Publication History
Published: 17 May 2021
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- Short-paper
- Research
- Refereed limited
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CONF-CDS 2021
CONF-CDS 2021: The 2nd International Conference on Computing and Data Science
January 28 - 30, 2021
CA, Stanford, USA
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