REVE 2021: 9th International Workshop on Reverse Variability Engineering
Abstract
Index Terms
- REVE 2021: 9th International Workshop on Reverse Variability Engineering
Recommendations
REVE 2018: 6th international workshop on reverse variability engineering
SPLC '18: Proceedings of the 22nd International Systems and Software Product Line Conference - Volume 1Software Product Line (SPL) migration remains a challenging endeavour. From organizational issues to purely technical challenges, there is a wide range of barriers that complicates SPL adoption. The workshop REverse Variability Engineering (REVE) aims ...
REVE 2017: 5th International Workshop on REverse Variability Engineering
SPLC '17: Proceedings of the 21st International Systems and Software Product Line Conference - Volume ASoftware Product Line (SPL) migration remains a challenging endeavour. From organizational issues to purely technical challenges, there is a wide range of barriers that complicates SPL adoption. The workshop REverse Variability Engineering (REVE) aims ...
REVE 2022: 10th International Workshop on REverse Variability Engineering
SPLC '22: Proceedings of the 26th ACM International Systems and Software Product Line Conference - Volume ASoftware Product Line (SPL) migration remains a challenging endeavor. From organizational issues to purely technical challenges, there is a wide range of barriers that complicates SPL adoption. This workshop aims to foster research about making the most ...
Comments
Information & Contributors
Information
Published In

Sponsors
Publisher
Association for Computing Machinery
New York, NY, United States
Publication History
Check for updates
Author Tags
Qualifiers
- Abstract
Conference
Acceptance Rates
Contributors
Other Metrics
Bibliometrics & Citations
Bibliometrics
Article Metrics
- 0Total Citations
- 37Total Downloads
- Downloads (Last 12 months)2
- Downloads (Last 6 weeks)0
Other Metrics
Citations
View Options
Login options
Check if you have access through your login credentials or your institution to get full access on this article.
Sign in