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Class Balanced Sampling for the Training in GANs

Published:14 December 2021Publication History

ABSTRACT

Recently Top-k fake sample selection has been introduced to provide better gradients for training Generative Adversarial Networks. Since the method does not guarantee class balance of selected samples in class conditional GANs, certain classes can be completely ignored in the training. In this work, we propose class standardized critic score based sample selection which enables class balanced sample selection. Our method achieves improved FID score and Intra-FID score compared to prior Top-k selection.

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References

  1. Andrew Brock, Jeff Donahue, and Karen Simonyan. 2018. Large Scale GAN Training for High Fidelity Natural Image Synthesis. International Conference on Learning Representations (2018).Google ScholarGoogle Scholar
  2. Terrance DeVries, Michal Drozdzal, and Graham W. Taylor. 2020. Instance Selection for GANs. NIPS (2020).Google ScholarGoogle Scholar
  3. Martin Heusel, Hubert Ramsauer, Thomas Unterthiner, Bernhard Nessler, and Sepp Hochreiter. 2017. GANs Trained by a Two Time-Scale Update Rule Converge to a Local Nash Equilibrium. NIPS (2017).Google ScholarGoogle Scholar
  4. Samarth Sinha, Zhengli Zhao, Anirudh Goyal, Colin Raffel, and Augustus Odena. 2020. Top-k Training of GANs: Improving GAN Performance by Throwing Away Bad Samples. NIPS (2020).Google ScholarGoogle Scholar

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  • Published in

    cover image ACM Conferences
    SA '21 Posters: SIGGRAPH Asia 2021 Posters
    December 2021
    87 pages
    ISBN:9781450386876
    DOI:10.1145/3476124
    • Editors:
    • Shuzo John Shiota,
    • Ayumi Kimura,
    • Wan-Chun Alex Ma

    Copyright © 2021 Owner/Author

    Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    • Published: 14 December 2021

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    • Refereed limited

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    Overall Acceptance Rate178of869submissions,20%
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